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@ARTICLE{Fevola:580737,
      author       = {Fevola, Giovanni and Ossig, Christina Sonja and Verezhak,
                      Mariana and Garrevoet, Jan and Guthrey, Harvey L. and
                      Seyrich, Martin and Brueckner, Dennis Bjoern and Hagemann,
                      Johannes and Seiboth, Frank and Schropp, Andreas and
                      Falkenberg, Gerald and Joergensen, Peter and Slyamov, Azat
                      and Balogh, Zoltan I. and Strelow, Christian and Kipp,
                      Tobias and Mews, Alf and Schroer, Christian and Nishiwaki,
                      Shiro and Carron, Romain and Andreasen, Jens Wenzel and
                      Stückelberger, Michael},
      title        = {3{D} and {M}ultimodal {X}‐{R}ay {M}icroscopy {R}eveals
                      the {I}mpact of {V}oids in {CIGS} {S}olar {C}ells},
      journal      = {Advanced science},
      volume       = {11},
      number       = {2},
      issn         = {2198-3844},
      address      = {Weinheim},
      publisher    = {Wiley-VCH},
      reportid     = {PUBDB-2023-01406},
      pages        = {2301873},
      year         = {2023},
      note         = {L:MB},
      abstract     = {Small voids in the absorber layer of thin-film solar cells
                      are generally suspected to impair photovoltaic performance.
                      They have been studied on Cu(In,Ga)Se$_2$ cells with
                      conventional laboratory techniques, albeit limited to
                      surface characterization and often affected by
                      sample-preparation artifacts. Here, synchrotron imaging is
                      performed on a fully operational as-deposited solar cell
                      containing a few tens of voids. By measuring operando
                      current and X-ray excited optical luminescence, the local
                      electrical and optical performance in the proximity of the
                      voids are estimated, and via ptychographic tomography, the
                      depth in the absorber of the voids is quantified. Besides,
                      the complex network of material-deficit structures between
                      the absorber and the top electrode is highlighted. Despite
                      certain local impairments, the massive presence of voids in
                      the absorber suggests they only have a limited detrimental
                      impact on performance.},
      cin          = {FS-PETRA-S / DOOR ; HAS-User / FS-PETRA / PSI},
      ddc          = {624},
      cid          = {I:(DE-H253)FS-PETRA-S-20210408 /
                      I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-PETRA-20140814
                      / I:(DE-H253)PSI-20200229},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632) / 6G3 - PETRA III (DESY) (POF4-6G3)},
      pid          = {G:(DE-HGF)POF4-632 / G:(DE-HGF)POF4-6G3},
      experiment   = {EXP:(DE-H253)P-P06-20150101},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {38009788},
      UT           = {WOS:001120685600001},
      doi          = {10.1002/advs.202301873},
      url          = {https://bib-pubdb1.desy.de/record/580737},
}