Home > Publications database > Current status of the End-of-Substructure (EoS) card project for the ATLAS Strip Tracker using final ASICs > print

001     486085
005     20230123125528.0
037 _ _ |a PUBDB-2022-07081
041 _ _ |a English
100 1 _ |a Boebel, Artur
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111 2 _ |a Topical Workshop of Electronics for Particle Physics
|g TWEPP 2022
|c Bergen
|d 2022-09-19 - 2022-09-23
|w Norway
245 _ _ |a Current status of the End-of-Substructure (EoS) card project for the ATLAS Strip Tracker using final ASICs
260 _ _ |c 2022
336 7 _ |a Conference Paper
|0 33
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336 7 _ |a Other
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336 7 _ |a INPROCEEDINGS
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336 7 _ |a Conference Presentation
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520 _ _ |a The silicon tracker of the ATLAS experiment will be upgraded for the upcoming High-Luminosity Upgradeof the LHC (HL-LHC). The main building blocks of the new strip tracker are modules that consist ofsilicon sensors and hybrid PCBs hosting the read-out ASICs. The modules are mounted on rigid carbon fibresubstructures, known as staves in the central barrel region and petals in the end-cap regions, thatprovide common services to all the modules. At the end of each stave or petal side, a so-called End-of-Substructure (EoS) card facilitates the transfer of data, power, and control signals between the modulesand the off-detector systems. The module front-end electronics transfer data to the EoS card on 640Mbit/s differential lines. The EoS connects up to 28 data lines to one or two lpGBT chips that providedata serialisation and uses a 10 GBit/s versatile optical link (VTRx+) to transmit signals to the off-detectorsystems. The lpGBT also recovers the LHC clock on the downlink and generates clock and control signalsfor the modules. To meet the tight integration requirements in the detector, several different EoScard designs are needed. Custom-made holders and clamps are produced to guide cables and opticalfibres as well as to shield the sensors from the opto-electric system. Here we present the production readyEoS card’s electronic design integrating final lpGBTv1 and VTRx+ ASICs from CERN, as well asresults from recent quality assurance tests including detailed characterisation of the opto-electronicssystem by its bit error rate, jitter, and eye diagram representation. Since each EoS sits at a single-point-of-failure for an entire stave or petal side, a dedicated quality control (QC) procedure for the production has been developed. An overview of the QC will also be presented.
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700 1 _ |a Ceslik, Harald
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700 1 _ |a Dam, M.
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700 1 _ |a Diez Cornell, Sergio
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700 1 _ |a Garvey, Cameron Michael
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700 1 _ |a Göttlicher, Peter
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700 1 _ |a Gregor, Ingrid-Maria
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700 1 _ |a Keaveney, James Michael
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700 1 _ |a Merwe, Max Nikoi van der
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700 1 _ |a Oechsle, J.
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700 1 _ |a Schmitt, Stefan
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700 1 _ |a Stanitzki, Marcel
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700 1 _ |a Stroem, Lars Rickard
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700 1 _ |a Wyngaard, J. R.
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856 4 _ |u https://indico.cern.ch/event/1127562/contributions/4904842/attachments/2514213/4325657/TWEPP_2022.pdf
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913 1 _ |a DE-HGF
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