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@INPROCEEDINGS{Boebel:486085,
author = {Boebel, Artur and Ceslik, Harald and Dam, M. and Diez
Cornell, Sergio and Garvey, Cameron Michael and Göttlicher,
Peter and Gregor, Ingrid-Maria and Keaveney, James Michael
and Merwe, Max Nikoi van der and Oechsle, J. and Schmitt,
Stefan and Stanitzki, Marcel and Stroem, Lars Rickard and
Wyngaard, J. R.},
title = {{C}urrent status of the {E}nd-of-{S}ubstructure ({E}o{S})
card project for the {ATLAS} {S}trip {T}racker using final
{ASIC}s},
reportid = {PUBDB-2022-07081},
year = {2022},
abstract = {The silicon tracker of the ATLAS experiment will be
upgraded for the upcoming High-Luminosity Upgradeof the LHC
(HL-LHC). The main building blocks of the new strip tracker
are modules that consist ofsilicon sensors and hybrid PCBs
hosting the read-out ASICs. The modules are mounted on rigid
carbon fibresubstructures, known as staves in the central
barrel region and petals in the end-cap regions, thatprovide
common services to all the modules. At the end of each stave
or petal side, a so-called End-of-Substructure (EoS) card
facilitates the transfer of data, power, and control signals
between the modulesand the off-detector systems. The module
front-end electronics transfer data to the EoS card on
640Mbit/s differential lines. The EoS connects up to 28 data
lines to one or two lpGBT chips that providedata
serialisation and uses a 10 GBit/s versatile optical link
(VTRx+) to transmit signals to the off-detectorsystems. The
lpGBT also recovers the LHC clock on the downlink and
generates clock and control signalsfor the modules. To meet
the tight integration requirements in the detector, several
different EoScard designs are needed. Custom-made holders
and clamps are produced to guide cables and opticalfibres as
well as to shield the sensors from the opto-electric system.
Here we present the production readyEoS card’s electronic
design integrating final lpGBTv1 and VTRx+ ASICs from CERN,
as well asresults from recent quality assurance tests
including detailed characterisation of the
opto-electronicssystem by its bit error rate, jitter, and
eye diagram representation. Since each EoS sits at a
single-point-of-failure for an entire stave or petal side, a
dedicated quality control (QC) procedure for the production
has been developed. An overview of the QC will also be
presented.},
month = {Sep},
date = {2022-09-19},
organization = {Topical Workshop of Electronics for
Particle Physics, Bergen (Norway), 19
Sep 2022 - 23 Sep 2022},
cin = {FE / FEB / FEA / FTX / ATLAS},
cid = {I:(DE-H253)FE-20120731 / I:(DE-H253)FEB-20120731 /
I:(DE-H253)FEA-20120731 / I:(DE-H253)FTX-20210408 /
I:(DE-H253)ATLAS-20120731},
pnm = {611 - Fundamental Particles and Forces (POF4-611)},
pid = {G:(DE-HGF)POF4-611},
experiment = {EXP:(DE-H253)LHC-Exp-ATLAS-20150101},
typ = {PUB:(DE-HGF)6},
url = {https://bib-pubdb1.desy.de/record/486085},
}