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@ARTICLE{Wiesner:485328,
      author       = {Wiesner, Felix and Skruszewicz, Slawomir and Rödel,
                      Christian and Abel, Johann Jakob and Reinhard, Julius and
                      Wünsche, Martin and Nathanael, Jan and Grünewald, Marco
                      and Hübner, Uwe and Paulus, Gerhard G. and Fuchs, Silvio},
      title        = {{C}haracterization of encapsulated graphene layers using
                      extreme ultraviolet coherence tomography},
      journal      = {Optics express},
      volume       = {30},
      number       = {18},
      issn         = {1094-4087},
      address      = {Washington, DC},
      publisher    = {Soc.},
      reportid     = {PUBDB-2022-06630},
      pages        = {32267 - 32279},
      year         = {2022},
      abstract     = {Many applications of two-dimensional materials such as
                      graphene require the encapsulation in bulk material. While a
                      variety of methods exist for the structural and functional
                      characterization of uncovered 2D materials, there is a need
                      for methods that image encapsulated 2D materials as well as
                      the surrounding matter. In this work, we use extreme
                      ultraviolet coherence tomography to image graphene flakes
                      buried beneath 200 nm of silicon. We show that we can
                      identify mono-, bi-, and trilayers of graphene and quantify
                      the thickness of the silicon bulk on top by measuring the
                      depth-resolved reflectivity. Furthermore, we estimate the
                      quality of the graphene interface by incorporating a model
                      that includes the interface roughness. These results are
                      verified by atomic force microscopy and prove that extreme
                      ultraviolet coherence tomography is a suitable tool for
                      imaging 2D materials embedded in bulk materials.},
      cin          = {FS-PS / Uni Jena},
      ddc          = {530},
      cid          = {I:(DE-H253)FS-PS-20131107 / $I:(DE-H253)Uni_Jena-20181204$},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632)},
      pid          = {G:(DE-HGF)POF4-632},
      experiment   = {EXP:(DE-MLZ)NOSPEC-20140101},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {36242292},
      UT           = {WOS:000850229100061},
      doi          = {10.1364/OE.464378},
      url          = {https://bib-pubdb1.desy.de/record/485328},
}