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@INPROCEEDINGS{SjgrenLevin:481544,
      author       = {Sjögren-Levin, E. and Pantleon, Wolfgang and Ahadi, A. and
                      Hegedüs, Z. and Lienert, U. and Tsuji, N. and Ameyama, K.
                      and Orlov, D.},
      title        = {{S}eparation of {XRD} peak profiles in single-phase metals
                      with bimodal grain structure to analyze stress partitioning},
      journal      = {IOP conference series / Materials science and engineering},
      volume       = {1249},
      number       = {1},
      issn         = {1757-8981},
      address      = {London [u.a.]},
      publisher    = {Institute of Physics},
      reportid     = {PUBDB-2022-04439},
      pages        = {012040},
      year         = {2022},
      abstract     = {Materials with bimodal grain size distributions have an
                      attractive combination of strength and ductility. Harmonic
                      structure materials are a category of bimodal-structure
                      materials with a specific microstructure design. The
                      deformation mechanisms of such novel materials during the
                      early stages of deformation are not well understood. Thus,
                      we deformed nickel with harmonic structure in tension until
                      a true strain of 0.04 while recording powder diffraction
                      patterns with high-energy synchrotron X-rays. Line profile
                      analysis based on such data enables quantification of stress
                      states and lattice defect densities in different phases in
                      multi-phase materials. Bimodal size distributions in
                      single-phase materials add extra complexity due to the
                      absence of differences in composition and crystal structure
                      causing the diffraction peaks from fine and coarse grains to
                      appear at the same diffraction angles. Therefore, prior to
                      any meaningful line profile analysis, the respective
                      diffraction profiles need to be separated. A general method
                      for automatically separating profiles originating from
                      different grain fractions in bimodal materials is presented
                      in this work.},
      month         = {Sep},
      date          = {2022-09-05},
      organization  = {42nd Risø International Symposium on
                       Materials Science Microstructural
                       variability: Processing, analysis,
                       mechanisms and properties, Roskilde
                       (Denmark), 5 Sep 2022 - 9 Sep 2022},
      cin          = {DOOR ; HAS-User / FS-PET-D / LUND},
      ddc          = {530},
      cid          = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-PET-D-20190712
                      / I:(DE-H253)LUND-20191211},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632) / 6G3 - PETRA III (DESY) (POF4-6G3) /
                      SWEDEN-DESY - SWEDEN-DESY Collaboration
                      $(2020_Join2-SWEDEN-DESY)$},
      pid          = {G:(DE-HGF)POF4-632 / G:(DE-HGF)POF4-6G3 /
                      $G:(DE-HGF)2020_Join2-SWEDEN-DESY$},
      experiment   = {EXP:(DE-H253)P-P21.2-20150101},
      typ          = {PUB:(DE-HGF)16 / PUB:(DE-HGF)8},
      doi          = {10.1088/1757-899X/1249/1/012040},
      url          = {https://bib-pubdb1.desy.de/record/481544},
}