000479599 001__ 479599 000479599 005__ 20250715180115.0 000479599 0247_ $$2doi$$a10.3390/app12147048 000479599 0247_ $$2datacite_doi$$a10.3204/PUBDB-2022-03162 000479599 0247_ $$2altmetric$$aaltmetric:132087085 000479599 0247_ $$2WOS$$aWOS:000833153700001 000479599 0247_ $$2openalex$$aopenalex:W4285093851 000479599 037__ $$aPUBDB-2022-03162 000479599 041__ $$aEnglish 000479599 082__ $$a600 000479599 1001_ $$0P:(DE-H253)PIP1097254$$aMohammadi Bidhendi, Mahdi$$b0$$eCorresponding author 000479599 245__ $$aFEL pulse duration evolution along undulators at FLASH 000479599 260__ $$aBasel$$bMDPI$$c2022 000479599 3367_ $$2DRIVER$$aarticle 000479599 3367_ $$2DataCite$$aOutput Types/Journal article 000479599 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1658410919_4264 000479599 3367_ $$2BibTeX$$aARTICLE 000479599 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000479599 3367_ $$00$$2EndNote$$aJournal Article 000479599 520__ $$aSelf-amplified spontaneous emission (SASE) free-electron lasers (FELs) deliver ultrashort pulses with femtosecond duration. Due to the fluctuating nature of the radiation properties of SASE FELs, characterizing the FEL pulses on a single shot basis is necessary. Therefore we use terahertz streaking to characterize the temporal properties of ultra-short extreme ultraviolet pulses from the free electron laser in Hamburg (FLASH). In this study, the pulse duration as well as the pulse energy are measured in a wavelength range from 8 to 34 nm as function of undulators contributing to the lasing process. 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