Home > Publications database > Crystal diffraction prediction and partiality estimation using Gaussian basis functions > print |
001 | 474903 | ||
005 | 20250715173332.0 | ||
024 | 7 | _ | |a 10.1107/S2053273323000682 |2 doi |
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100 | 1 | _ | |a Brehm, Wolfgang |0 P:(DE-H253)PIP1033390 |b 0 |e Corresponding author |
245 | _ | _ | |a Crystal diffraction prediction and partiality estimation using Gaussian basis functions |
260 | _ | _ | |a Oxford [u.a.] |c 2023 |b Blackwell |
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520 | _ | _ | |a The recent diversification in macromolecular crystallographic experiments to pink beams, convergent electron diffraction and serial crystallography has shown the limitations of using the Laue equations for diffraction prediction. This publication aims to give a straightforward way of calculating approximate crystal diffraction patterns given varying distributions of the incoming beam, crystal shapes and other potentially hidden parameters. This approach models each pixel of a diffraction pattern and improves data processing of integrated peak intensities by enabling the correction of partially recorded reflections.The fundamental idea is to express the distributions as weighted sums of Gaussian functions. |
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700 | 1 | _ | |a White, Thomas |0 P:(DE-H253)PIP1010779 |b 1 |
700 | 1 | _ | |a Chapman, Henry N. |0 P:(DE-H253)PIP1006324 |b 2 |e Corresponding author |
773 | _ | _ | |a 10.1107/S2053273323000682 |g Vol. 79, no. 2, p. 145 - 162 |0 PERI:(DE-600)2020844-3 |n 2 |p 145 - 162 |t Acta crystallographica / A |v 79 |y 2023 |x 0108-7673 |
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