%0 Book Section
%A Schäfer, Bernd
%A Flöter, Bernhard
%A Mey, Tobias
%A Mann, Klaus
%T Wavefront and Coherence Characteristics of Extreme UV and Soft X-ray Sources
%V 134
%C Cham
%I Springer International Publishing
%M PUBDB-2021-00656
%@ 978-3-030-34412-2 (print)
%B Topics in Applied Physics
%P 531 - 548
%D 2020
%< Nanoscale Photonic Imaging / Salditt, Tim (Editor) ; Cham : Springer International Publishing, 2020, Chapter 20 ; ISSN: 0303-4216=1437-0859 ; ISBN: 978-3-030-34412-2=978-3-030-34413-9 ; doi:10.1007/978-3-030-34413-9
%X The first part of this chapter comprises setups and results of the determination of wavefront and beam parameters for different EUV sources (free-electron lasers, HHG-sources, synchrotron radiation) by self supporting Hartmann-Sensors. We present here i.a. a sensor applied for alignment of the ellipsodial mirror at FLASH beamline 2, yielding a reduction of the rms-wavefront aberrations by more than a factor of 3. In the second part we report on the characterization of the Free-Electron-Laser FLASH at DESY by a quantitative determination of the Wigner distribution function. The setup, comprising an ellipsodial mirror and a moveable extreme UV sensitive CCD detector, enables the mapping of two-dimensional phase space corresponding to the horizontal and vertical coordinate axes, respectively. Furthermore, an extended setup utilizing a torodial mirror for complete 4D-Wigner reconstruction has been accomplished and tested using radiation from a multimode Nd:VO4 laser.
%F PUB:(DE-HGF)7
%9 Contribution to a book
%U <Go to ISI:>//WOS:000546519000021
%R 10.1007/978-3-030-34413-9_20
%U https://bib-pubdb1.desy.de/record/454662