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@ARTICLE{Ren:454625,
      author       = {Ren, Zhe and Cornelius, T. W. and Leclere, C. and Davydok,
                      A. and Micha, J.-S. and Robach, O. and Richter, G. and
                      Thomas, O.},
      title        = {{F}irst stages of plasticity in three-point bent {A}u
                      nanowires detected by in situ {L}aue microdiffraction},
      journal      = {Applied physics letters},
      volume       = {116},
      number       = {24},
      issn         = {1077-3118},
      address      = {Melville, NY},
      publisher    = {American Inst. of Physics},
      reportid     = {PUBDB-2021-00627},
      pages        = {243101},
      year         = {2020},
      abstract     = {The first stages of plasticity in three-point bent Au
                      nanowires are investigated by in situ three-point bending
                      tests in combination with Laue micro-diffraction. To
                      separate the elastic and plastic deformation,
                      loading–unloading cycles were performed with increasing
                      load in each consecutive cycle. The storage of the first
                      four geometrically necessary dislocations of
                      [011⎯⎯](111)slip system is observed in the vicinity of
                      both clamping points, which might be attributed to the local
                      rotations induced by the rigid Si support. At later stages
                      of the deformation, additional slip systems are activated
                      either by the torsion of the nanowire or by unintentional
                      indentation from the AFM tip. The cyclic loading–unloading
                      approach combined with Laue microdiffraction thus allows to
                      study the onset of plasticity in defect-scarce
                      nanostructures deformed by bending, offering additional
                      possibilities in studying the dislocation nucleation process
                      in bent nano-objects, which are essential for future
                      applications, e.g., in flexible electronics and
                      nano-electromechanical systems.The authors gratefully
                      acknowledge the financial support from the French National
                      Research Agency through Project No. ANR-11-BS10-0014
                      MecaniX. They further thank the French CRG program committee
                      for the allocated beamtime at the BM32 beamline at ESRF and
                      L. Belliard at INSP in Paris (France) for providing the Si
                      micro-trenches.},
      cin          = {FS-PET-S},
      ddc          = {530},
      cid          = {I:(DE-H253)FS-PET-S-20190712},
      pnm          = {6214 - Nanoscience and Materials for Information Technology
                      (POF3-621)},
      pid          = {G:(DE-HGF)POF3-6214},
      experiment   = {EXP:(DE-MLZ)External-20140101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000542645000001},
      doi          = {10.1063/5.0012816},
      url          = {https://bib-pubdb1.desy.de/record/454625},
}