TY  - JOUR
AU  - Kujala, Naresh
AU  - Freund, Wolfgang
AU  - Liu, Jia
AU  - Koch, Andreas
AU  - Falk, Torben
AU  - Planas, Marc
AU  - Dietrich, Florian
AU  - Laksman, Joakim
AU  - Maltezopoulos, Theophilos
AU  - Risch, Johannes
AU  - Dall’Antonia, Fabio
AU  - Grünert, Jan
TI  - Hard x-ray single-shot spectrometer at the European X-ray Free-Electron Laser
JO  - Review of scientific instruments
VL  - 91
IS  - 10
SN  - 1089-7623
CY  - [S.l.]
PB  - American Institute of Physics
M1  - PUBDB-2021-00609
SP  - 103101 
PY  - 2020
AB  - The European X-ray Free-Electron Laser Facility in Germany delivers x-ray pulses with femtosecond pulse duration at a repetition rate of up to 4.5 MHz. The free-electron laser radiation is created by the self-amplified spontaneous emission (SASE) process, whose stochastic nature gives rise to shot-to-shot fluctuations in most beam properties, including spectrum, pulse energy, spatial profile, wavefront, and temporal profile. Each spectrum consisting of many spikes varies in width and amplitude that appear differently within the envelope of the SASE spectrum. In order to measure and study the SASE spectrum, the HIgh REsolution hard X-ray single-shot (HIREX) spectrometer was installed in the photon tunnel of the SASE1 undulator beamline. It is based on diamond gratings, bent crystals as a dispersive element, and a MHz-repetition-rate strip detector. It covers a photon energy range of 3 keV–25 keV and a bandwidth of 0.5
LB  - PUB:(DE-HGF)16
C6  - pmid:33138553
UR  - <Go to ISI:>//WOS:000577161900001
DO  - DOI:10.1063/5.0019935
UR  - https://bib-pubdb1.desy.de/record/454607
ER  -