TY  - JOUR
AU  - Barranco, Angel
AU  - Lopez-Santos, Maria C.
AU  - Idigoras, Jesus
AU  - Aparicio, Francisco J.
AU  - Obrero-Perez, Jose
AU  - Lopez-Flores, Victor
AU  - Contreras-Bernal, Lidia
AU  - Rico, Victor
AU  - Ferrer, Javier
AU  - Espinos, Juan P.
AU  - Borras, Ana
AU  - Anta, Juan A.
AU  - Sanchez-Valencia, Juan Ramon
TI  - Enhanced Stability of Perovskite Solar Cells Incorporating Dopant‐Free Crystalline Spiro‐OMeTAD Layers by Vacuum Sublimation
JO  - Advanced energy materials
VL  - 10
IS  - 2
SN  - 1614-6840
CY  - Weinheim
PB  - Wiley-VCH
M1  - PUBDB-2021-00364
SP  - 1901524
PY  - 2020
AB  - The main handicap still hindering the eventual exploitation of organometal halide perovskite‐based solar cells is their poor stability under prolonged illumination, ambient conditions, and increased temperatures. This article shows for the first time the vacuum processing of the most widely used solid‐state hole conductor (SSHC), i.e., the Spiro‐OMeTAD [2,2′,7,7′‐tetrakis (N,N‐di‐p‐methoxyphenyl‐amine) 9,9′‐spirobifluorene], and how its dopant‐free crystalline formation unprecedently improves perovskite solar cell (PSC) stability under continuous illumination by about two orders of magnitude with respect to the solution‐processed reference and after annealing in air up to 200 °C. It is demonstrated that the control over the temperature of the samples during the vacuum deposition enhances the crystallinity of the SSHC, obtaining a preferential orientation along the π–π stacking direction. These results may represent a milestone toward the full vacuum processing of hybrid organic halide PSCs as well as light‐emitting diodes, with promising impacts on the development of durable devices. The microstructure, purity, and crystallinity of the vacuum sublimated Spiro‐OMeTAD layers are fully elucidated by applying an unparalleled set of complementary characterization techniques, including scanning electron microscopy, X‐ray diffraction, grazing‐incidence small‐angle X‐ray scattering and grazing‐incidence wide‐angle X‐ray scattering, X‐ray photoelectron spectroscopy, and Rutherford backscattering spectroscopy.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000493839500001
DO  - DOI:10.1002/aenm.201901524
UR  - https://bib-pubdb1.desy.de/record/454007
ER  -