TY  - JOUR
AU  - Langberg, Marie
AU  - Zhang, Fan
AU  - Graanaes, Elin
AU  - Oernek, Cem
AU  - Cheng, Jie
AU  - Liu, Min
AU  - Wiemann, Carsten
AU  - Gloskovskii, Andrei
AU  - Keller, Thomas F.
AU  - Schlueter, Christoph
AU  - Kulkarni, Satishkumar
AU  - Noei, Heshmat
AU  - Lindell, David
AU  - Kivisaekk, Ulf
AU  - Lundgren, Edvin
AU  - Stierle, Andreas
AU  - Pan, Jinshan
TI  - Lateral Variation of the Native Passive Film on Super Duplex Stainless Steel Resolved by Synchrotron Hard X-Ray Photoelectron Emission Microscopy
JO  - Corrosion science
VL  - 174
SN  - 0010-938X
CY  - Amsterdam [u.a.]
PB  - Elsevier Science
M1  - PUBDB-2020-02560
SP  - 108841
PY  - 2020
AB  - A native passive film on 25Cr-7Ni super duplex stainless steel was analyzed using synchrotronhard X-ray photoemission electron microscopy, focusing on variations between individualgrains of ferrite and austenite phases. The film consists of an oxide inner layer and anoxyhydroxide outer layer, in total 2.3 nm thick. The Cr content is higher in the outer than theinner layer, ca. 80
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000569368200003
DO  - DOI:10.1016/j.corsci.2020.108841
UR  - https://bib-pubdb1.desy.de/record/441562
ER  -