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@ARTICLE{Fedchenko:434660,
      author       = {Fedchenko, O. and Winkelmann, A. and Medjanik, K. and
                      Babenkov, S. and Vasilyev, D. and Chernov, S. and Schlueter,
                      C. and Gloskovskii, A. and Matveyev, Yu and Drube, W. and
                      Schönhense, B. and Elmers, H. J. and Schönhense, G.},
      title        = {{H}igh-resolution hard-x-ray photoelectron diffraction in a
                      momentum microscope—the model case of graphite},
      journal      = {New journal of physics},
      volume       = {21},
      number       = {11},
      issn         = {1367-2630},
      address      = {[London]},
      publisher    = {IOP},
      reportid     = {PUBDB-2020-00221},
      pages        = {113031 -},
      year         = {2019},
      abstract     = {Hard x-ray photoelectron diffraction (hXPD) patterns
                      recorded with a momentum microscope withhigh k-resolution
                      (0.025 Å−1 equivalent to an angular resolution of 0.034°
                      at 7 keV) revealunprecedented rich fine structure.Wehave
                      studied hXPD of theC1s core level in the prototypicallow-Z
                      material Graphite at 20 photon energies between 2.8 and 7.3
                      keV. Sharp bright and dark linesshift with energy; regions
                      of Kikuchi band crossings near zone axis exhibit a filigree
                      structure whichvaries rapidly with energy. Calculations
                      based on the Bloch wave approach to electron diffraction
                      fromlattice planes show excellent agreement with the
                      experimental results throughout the entire energyrange. The
                      main Kikuchi bands in the [001] zone axis appear fixed on
                      the momentum scale with awidth of the corresponding
                      reciprocal lattice vector, allowing to reconstruct the size
                      of the projectedBrillouin zone. The newly developed
                      high-energy k-microscope allows full-field imaging of(kx,
                      ky)-distributions in large k-fields (up to>22 Å−1 dia.)
                      and time-of-flight energy recording.},
      cin          = {DOOR ; HAS-User / FS-PET-S},
      ddc          = {530},
      cid          = {I:(DE-H253)HAS-User-20120731 /
                      I:(DE-H253)FS-PET-S-20190712},
      pnm          = {6G3 - PETRA III (POF3-622) / 6213 - Materials and Processes
                      for Energy and Transport Technologies (POF3-621)},
      pid          = {G:(DE-HGF)POF3-6G3 / G:(DE-HGF)POF3-6213},
      experiment   = {EXP:(DE-H253)P-P22-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000499447400001},
      doi          = {10.1088/1367-2630/ab51fe},
      url          = {https://bib-pubdb1.desy.de/record/434660},
}