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000428414 1001_ $$0P:(DE-H253)PIP1007333$$aSchwinkendorf, Jan-Patrick$$b0$$eCorresponding author
000428414 245__ $$aCharge calibration of DRZ scintillation phosphor screens
000428414 260__ $$aLondon$$bInst. of Physics$$c2019
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000428414 520__ $$aAs a basic diagnostic tool, scintillation screens are employed in particle acceleratorsto detect charged particles. In extension to the recent revision on the calibration of scintillationscreens commonly applied in the context of plasma acceleration [T. Kurz et al.,Rev. Sci. Instrum.89(2018) 093303], here we present the charge calibration of three DRZ screens (Std, Plus, High), whichpromise to offer similar spatial resolution to other screen types whilst reaching higher conversionefficiencies. The calibration was performed at the Electron Linac for beams with high Brilliance andlow Emittance (ELBE) at the Helmholtz-Zentrum Dresden-Rossendorf, which delivers picosecond-long beams of up to 40 MeV energy. Compared to the most sensitive screen, Kodak BioMAX MS,of the aforementioned recent investigation by Kurz et al., the sample with highest yield in thiscampaign, DRZ High, revealed a 30% increase in light yield. The detection threshold with thesescreens was found to be below 10 pC/mm2. For higher charge-densities (several nC/mm2) saturationeffects were observed. In contrast to the recent reported work, the DRZ screens were more robust,demonstrating higher durability under the same high level of charge deposition.
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000428414 7001_ $$0P:(DE-H253)PIP1019641$$aBohlen, S.$$b1
000428414 7001_ $$0P:(DE-HGF)0$$aCouperus Cabadağ, J. P.$$b2
000428414 7001_ $$0P:(DE-HGF)0$$aDing, H.$$b3
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000428414 7001_ $$0P:(DE-HGF)0$$aKöhler, A.$$b6
000428414 7001_ $$0P:(DE-HGF)0$$aKrämer, J. M.$$b7
000428414 7001_ $$0P:(DE-HGF)0$$aKurz, T.$$b8
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000428414 7001_ $$0P:(DE-HGF)0$$aZarini, O.$$b14
000428414 7001_ $$0P:(DE-H253)PIP1027904$$aD'Arcy, R.$$b15$$eCorresponding author
000428414 773__ $$0PERI:(DE-600)2235672-1$$a10.1088/1748-0221/14/09/P09025$$gVol. 14, no. 09, p. P09025 - P09025$$n09$$pP09025 - P09025$$tJournal of Instrumentation$$v14$$x1748-0221$$y2019
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