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@ARTICLE{Kalcska:426593,
      author       = {Kalácska, Szilvia and Dankházi, Zoltán and Zilahi, Gyula
                      and Maeder, Xavier and Michler, Johann and Ispánovity,
                      Péter Dusán and Groma, István},
      title        = {{I}nvestigation of geometrically necessary dislocation
                      structures in compressed {C}u micropillars by 3-dimensional
                      {HR}-{EBSD}},
      journal      = {Materials science and engineering / A Structural materials
                      : properties, microstructure and processing properties,
                      microstructure and processing},
      volume       = {770},
      issn         = {0921-5093},
      address      = {Amsterdam},
      publisher    = {Elsevier},
      reportid     = {PUBDB-2019-03804},
      pages        = {138499 -},
      year         = {2020},
      note         = {© Elsevier B.V.},
      abstract     = {Mechanical testing of micropillars is a field that involves
                      new physics, as the behaviour of materials is
                      non-deterministic at this scale. To better understand their
                      deformation mechanisms we applied 3-dimensional high angular
                      resolution electron backscatter diffraction (3D HR-EBSD) to
                      reveal the dislocation distribution in deformed single
                      crystal copper micropillars. Identical micropillars
                      (6 μm μm μm in size) were fabricated by focused ion
                      beam (FIB) and compressed at room temperature. The
                      deformation process was stopped at different strain levels (
                      , and ) to study the evolution of geometrically necessary
                      dislocations (GNDs). Serial slicing with FIB and consecutive
                      HR-EBSD mapping on the (100) side was used to create and
                      compare 3-dimensional maps of the deformed volumes. Average
                      GND densities were calculated for each deformation step.
                      Total dislocation density calculation based on X-ray
                      synchrotron measurements were conducted on the pillar to
                      compare dislocation densities determined by the two
                      complementary methods. Scanning transmission electron
                      microscopy (STEM) and transmission electron microscopy (TEM)
                      images were captured on the pillar to visualize the actual
                      dislocation structure. With the 3D HR-EBSD technique we have
                      studied the geometrically necessary dislocations evolving
                      during the deformation of micropillars. An intermediate
                      behaviour was found at the studied sample size between bulk
                      and nanoscale plasticity: A well-developed dislocation cell
                      structure built up upon deformation but with significantly
                      lower GND density than in bulk. This explains the
                      simultaneous observation of strain hardening and size effect
                      at this scale.},
      cin          = {DOOR ; HAS-User},
      ddc          = {530},
      cid          = {I:(DE-H253)HAS-User-20120731},
      pnm          = {6G3 - PETRA III (POF3-622)},
      pid          = {G:(DE-HGF)POF3-6G3},
      experiment   = {EXP:(DE-H253)P-P21.2-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000501394000002},
      doi          = {10.1016/j.msea.2019.138499},
      url          = {https://bib-pubdb1.desy.de/record/426593},
}