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@INBOOK{Bajt:419696,
      author       = {Bajt, Saša and Schroer, Christian},
      title        = {{S}ub-micrometer {F}ocusing and {H}igh-{R}esolution
                      {I}maging with {R}efractive {L}enses and {M}ultilayer {L}aue
                      {O}ptics},
      address      = {Cham},
      publisher    = {Springer International Publishing},
      reportid     = {PUBDB-2019-01225},
      pages        = {1-28},
      year         = {2019},
      note         = {© Springer Nature Switzerland AG; Post referee fulltext in
                      progress; Embargo 12 months from publication},
      comment      = {Synchrotron Light Sources and Free-Electron Lasers /
                      Jaeschke, Eberhard (Editor) ; Cham : Springer International
                      Publishing, 2019, Chapter 62-1 ; ISBN: 978-3-319-04507-8 ;
                      doi:10.1007/978-3-319-04507-8},
      booktitle     = {Synchrotron Light Sources and
                       Free-Electron Lasers / Jaeschke,
                       Eberhard (Editor) ; Cham : Springer
                       International Publishing, 2019, Chapter
                       62-1 ; ISBN: 978-3-319-04507-8 ;
                       doi:10.1007/978-3-319-04507-8},
      abstract     = {In this chapter we describe the fundamentals of X-ray
                      optics with a particular emphasis on refractive and
                      diffractive optics for high-resolution X-ray microscopy. To
                      understand the physical limitations of X-ray microscopy and
                      X-ray optics, a wave-optical treatment of the interaction of
                      X-rays with the optical elements is needed. As all optics
                      exploit elastic X-ray scattering in the form of refraction,
                      reflection, or diffraction, these phenomena are reviewed,
                      modeling matter by its complex index of refraction. The
                      smallest probe sizes are reached at the diffraction limit.
                      In that case, the focal spot size depends only on the
                      numerical aperture of the optical element at a given
                      wavelength. We discuss refractive and diffractive optics in
                      view of optimal numerical aperture and give a few
                      application examples in full-field and scanning microscopy.},
      cin          = {FS-PETRA / CFEL-XOM},
      cid          = {I:(DE-H253)FS-PETRA-20140814 /
                      I:(DE-H253)CFEL-XOM-20160915},
      pnm          = {6214 - Nanoscience and Materials for Information Technology
                      (POF3-621) / 6G3 - PETRA III (POF3-622)},
      pid          = {G:(DE-HGF)POF3-6214 / G:(DE-HGF)POF3-6G3},
      experiment   = {EXP:(DE-H253)P-P06-20150101 / EXP:(DE-H253)P-P11-20150101 /
                      EXP:(DE-MLZ)External-20140101},
      typ          = {PUB:(DE-HGF)7},
      doi          = {10.1007/978-3-319-04507-8_62-1},
      url          = {https://bib-pubdb1.desy.de/record/419696},
}