TY  - JOUR
AU  - Gamcová, Jana
AU  - Milkovič, Ondrej
AU  - Németh, Dušan
AU  - Mohanty, Gaurav
AU  - Michalik, Štefan
AU  - Wehrs, Juri
AU  - Bednarčík, Jozef
AU  - Krywka, Christina
AU  - Breguet, Jean-Marc
AU  - Michler, Johann
AU  - Sovák, Pavol
AU  - Franz, Hermann
TI  - Comparison Study of Internal Stress Measured by Diffraction Mapping and Calculation Using FEM
JO  - Key engineering materials
VL  - 784
SN  - 1662-9795
CY  - Uetikon a.S.
PB  - Trans Tech Publications
M1  - PUBDB-2019-01170
SP  - 120 - 123
PY  - 2018
N1  - © Trans Tech Publications, Switzerland; Post referee fulltext in progress 2
AB  - The measuring of internal stress has not only a great scientific aspect, but is particularly important for nondestructive description of component or products in industry. It is expected that exceeding of local mechanical limits in the material can have catastrophic consequences. In this paper is mapped the deformation field of amorphous material under the nanoindenter tip using diffraction in Debye-Scherrer geometry. Using the FEM analysis, it was modeled the deformation field in such material. There is a great match in between measured and calculated data. The result is pointing out on large limits of internal stresses measuring by conventional standard methods.
LB  - PUB:(DE-HGF)16
DO  - DOI:10.4028/www.scientific.net/KEM.784.120
UR  - https://bib-pubdb1.desy.de/record/419536
ER  -