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| 100 | 1 | _ | |a Ye, Hong |0 P:(DE-H253)PIP1020650 |b 0 |e Corresponding author |
| 111 | 2 | _ | |a 9th International Particle Accelerator Conference |g IPAC'18 |c Vancouver |d 2018-04-29 - 2018-05-04 |w Canada |
| 245 | _ | _ | |a Characterization of Polarization-Dependent Emittance From an Array of Au Nanorods using Velocity Map Imaging Spectrometer |
| 260 | _ | _ | |a Geneva |c 2018 |b JACoW Publishing |
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| 520 | _ | _ | |a Electron beams of high quality, e.g., low emittance, are of crucial importance for cutting-edge scientific instruments, such as x-ray free electron lasers (XFELs) and ultrafast electron diffraction (UED) setups. A velocity-map-imaging (VMI) spectrometer was implemented to characterize the intrinsic root-mean-square (rms) normalized emittance from photocathodes. The spectrometer operated in both, spatial map imaging (SMI) and VMI modes. Therefore, spatial- and velocity-coordinates were recorded independently and quickly. The technique allows for fast complete emittance measurements, within minutes. A 75 μm pitch array of Au nanorods of dimension 100 × 30 ~ nm, was studied under strong-field-emission regime by 100 fs 1 kHz 1.3 μm laser pulses with a 300 × 30 μm² focus spot size on the sample. A patterned electron bunch was observed, each emitted from a single nanorod within the array. A polarization dependent photoemission study was performed showing a smaller rms-normalized divergence of 0.8 mrad with the laser polarization normal to the sample surface, compared to 1.15 mrad for the parallel case. |
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