%0 Conference Paper
%A Ye, Hong
%A Fallahi, Arya
%A Kärtner, Franz
%A Küpper, Jochen
%A Muecke, Oliver
%A Rossi, Giulio Maria
%A Trippel, Sebastian
%T Characterization of Polarization-Dependent Emittance From an Array of Au Nanorods using Velocity Map Imaging Spectrometer
%C Geneva
%I JACoW Publishing
%M PUBDB-2018-03279
%@ 978-3-95450-184-7
%P 1612-1614
%D 2018
%X Electron beams of high quality, e.g., low emittance, are of crucial importance for cutting-edge scientific instruments, such as x-ray free electron lasers (XFELs) and ultrafast electron diffraction (UED) setups. A velocity-map-imaging (VMI) spectrometer was implemented to characterize the intrinsic root-mean-square (rms) normalized emittance from photocathodes. The spectrometer operated in both, spatial map imaging (SMI) and VMI modes. Therefore, spatial- and velocity-coordinates were recorded independently and quickly. The technique allows for fast complete emittance measurements, within minutes. A 75 μm pitch array of Au nanorods of dimension 100 × 30   nm, was studied under strong-field-emission regime by 100 fs 1 kHz 1.3 μm laser pulses with a 300 × 30 μm² focus spot size on the sample. A patterned electron bunch was observed, each emitted from a single nanorod within the array. A polarization dependent photoemission study was performed showing a smaller rms-normalized divergence of 0.8 mrad with the laser polarization normal to the sample surface, compared to 1.15 mrad for the parallel case.
%B 9th International Particle Accelerator Conference
%C 29 Apr 2018 - 4 May 2018, Vancouver (Canada)
Y2 29 Apr 2018 - 4 May 2018
M2 Vancouver, Canada
%F PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
%9 Contribution to a conference proceedingsContribution to a book
%R 10.18429/JACOW-IPAC2018-TUPML031
%U https://bib-pubdb1.desy.de/record/409100