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@ARTICLE{Posselt:396821,
      author       = {Posselt, Dorthe and Zhang, Jianqi and Smilgies, Detlef-M.
                      and Berezkin, Anatoly V. and Potemkin, Igor I. and
                      Papadakis, Christine M.},
      title        = {{R}estructuring in block copolymer thin films: {I}n situ
                      {GISAXS} investigations during solvent vapor annealing},
      journal      = {Progress in polymer science},
      volume       = {66},
      issn         = {0079-6700},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier Science},
      reportid     = {PUBDB-2017-12901},
      pages        = {80 - 115},
      year         = {2017},
      note         = {© Elsevier B.V. ; Post referee fulltext in progress;
                      Embargo 12 months from publication},
      abstract     = {Block copolymer (BCP) thin films have been proposed for a
                      number of nanotechnology applications, such as
                      nanolithography and as nanotemplates, nanoporous membranes
                      and sensors. Solvent vapor annealing (SVA) has emerged as a
                      powerful technique for manipulating and controlling the
                      structure of BCP thin films, e.g., by healing defects, by
                      altering the orientation of the microdomains and by changing
                      the morphology. Due to high time resolution and
                      compatibility with SVA environments, grazing-incidence
                      small-angle X-ray scattering (GISAXS) is an indispensable
                      technique for studying the SVA process, providing
                      information of the BCP thin film structure both laterally
                      and along the film normal. Especially, state-of-the-art
                      combined GISAXS/SVA setups at synchrotron sources have
                      facilitated in situ and real-time studies of the SVA process
                      with a time resolution of a few seconds, giving important
                      insight into the pathways and mechanisms of SVA induced
                      restructuring. We give a short introduction to the GISAXS
                      method and review recent theoretical studies, experimental
                      techniques such as sample preparation and in situ chambers
                      together with SVA protocols, and we review and discuss
                      experimental results. We conclude by giving an outlook on
                      emerging developments of the in situ real-time GISAXS
                      scattering technique in combination with new approaches to
                      control BCP thin film structures using SVA.},
      cin          = {DOOR},
      ddc          = {540},
      cid          = {I:(DE-H253)HAS-User-20120731},
      pnm          = {899 - ohne Topic (POF3-899)},
      pid          = {G:(DE-HGF)POF3-899},
      experiment   = {EXP:(DE-H253)D-BW4-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000396958500004},
      doi          = {10.1016/j.progpolymsci.2016.09.009},
      url          = {https://bib-pubdb1.desy.de/record/396821},
}