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@ARTICLE{Gutmann:391859,
      author       = {Gutmann, Jochen S. and Müller-Buschbaum, Peter and Stamm,
                      Manfred},
      title        = {{C}omplex pattern formation by phase separation of polymer
                      blends in thin films},
      journal      = {Faraday discussions},
      volume       = {112},
      issn         = {1364-5498},
      address      = {Cambridge [u.a.]},
      publisher    = {Soc.},
      reportid     = {PUBDB-2017-10510},
      pages        = {285 - 297},
      year         = {1999},
      note         = {F-Bereich; HASYLAB},
      abstract     = {During spin coating of very thin films from a solution of
                      incompatible polymers quite interesting lateral structures
                      are forming. From scanning force microscopy (SFM) and X-ray
                      reflectometry it is concluded that a surface height
                      modulation is present, which reflects at the surface the
                      phase separated morphology of the blend in the film. Those
                      structures depend critically on different parameters like
                      relative concentration of the components, spinning
                      parameters, solvent quality or compatibility of the blend.
                      In blends of different statistical copolymers of
                      poly-styrene-stat-para-bromo-styrene the compatibility
                      between the blended polymers depends on the difference in
                      the degree of bromination. This allows a variation of the
                      interaction parameter within a wide range. Besides
                      relatively incompatible materials, also weakly incompatible
                      mixtures are of interest. Such a system with an almost
                      vanishing but still positive interaction parameter is
                      realized with blends of poly-styrene and
                      poly-para-methyl-styrene. Ultra thin polymer films with
                      thicknesses between 2 to 4 RG were prepared by solvent
                      quenches from homogeneous solution. The lateral structures
                      created during the quench are examined with SFM. The SFM
                      pictures are statistically analysed in terms of their
                      Fourier components. From the power spectral density function
                      the most prominent in-plane length scale is extracted. This
                      analysis of a mean distance is complemented by the use of
                      Minkowski measures.},
      cin          = {DESY(-2012)},
      ddc          = {540},
      cid          = {$I:(DE-H253)DESY_-2012_-20170516$},
      pnm          = {899 - ohne Topic (POF3-899)},
      pid          = {G:(DE-HGF)POF3-899},
      experiment   = {EXP:(DE-MLZ)NOSPEC-20140101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000082190600021},
      doi          = {10.1039/a809088b},
      url          = {https://bib-pubdb1.desy.de/record/391859},
}