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@ARTICLE{Eichhorn:331159,
      author       = {Eichhorn, Klaus D.},
      title        = {{S}ingle-crystal {X}-ray diffractometry using synchrotron
                      radiation},
      journal      = {European journal of mineralogy},
      volume       = {9},
      number       = {4},
      issn         = {0935-1221},
      address      = {Alexandria, Va.},
      publisher    = {GeoScienceWorld},
      reportid     = {PUBDB-2017-07582},
      pages        = {673 - 692},
      year         = {1997},
      note         = {F-Bereich; HASYLAB; no PDF-File},
      abstract     = {The high brilliance over a wide spectral range up into the
                      hard X-ray region, the small source size and low divergence,
                      the polarization properties and the pulsed time structure
                      are outstanding properties of synchrotron radiation that
                      extend the range of single-crystal X-ray diffractometry to
                      experiments which are not feasable with conventional
                      sources, such as sealed X-ray tube or rotating anode
                      equipments. There is almost no field of X-ray diffraction
                      that cannot profit from the use of synchrotron radiation.
                      Data collection techniques depend on the general goals of a
                      diffraction experiment, but also on source and beamline
                      optics, on the sample quality, its absorption and scattering
                      power, as well as on the instrumental resolution function
                      and the resulting reflection profile shape. Often, the
                      sample properties play a crucial role, and not all samples
                      may be suitable for data collection with synchrotron X-rays.
                      The high intensity requires detectors with high count-rate
                      capabilities; area detectors are highly desirable for
                      high-speed data collection and maximum throughput. The time
                      dependence of the primary beam intensity and of its
                      polarization state requires monitoring and normalization to
                      monitor counts, which complicates data collection and data
                      reduction due to source of both random and systematic errors
                      not encountered in conventional X-ray sources. X-ray
                      diffraction with synchrotron radiation can yield structure
                      factors of unprecedented quality, provided proper attention
                      is given to sample properties, data collection strategy and
                      data evaluation procedures. Synchrotron radiation does not,
                      however, provide a solution to all problems, in some cases
                      laboratory X-ray sources may be more appropriate. Given the
                      limited access to synchrotron radiation facilities, X-ray
                      diffraction with synchrotron radiation can only supplement,
                      but not replace conventional X-ray sources and diffraction
                      techniques.},
      cin          = {DESY(-2012)},
      ddc          = {550},
      cid          = {$I:(DE-H253)DESY_-2012_-20170516$},
      pnm          = {899 - ohne Topic (POF3-899)},
      pid          = {G:(DE-HGF)POF3-899},
      experiment   = {EXP:(DE-MLZ)NOSPEC-20140101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:00},
      doi          = {10.1127/ejm/9/4/0673},
      url          = {https://bib-pubdb1.desy.de/record/331159},
}