Home > Publications database > Measurement of the lifetime of the tau lepton > print

001     330766
005     20250810053109.0
024 7 _ |a 10.1016/S0370-2693(96)01392-5
|2 doi
024 7 _ |a 0370-2693
|2 ISSN
024 7 _ |a 1873-2445
|2 ISSN
024 7 _ |a WOS:A1996VW84500029
|2 WOS
024 7 _ |a inspire:424070
|2 inspire
024 7 _ |a openalex:W2140670251
|2 openalex
024 7 _ |a altmetric:15477141
|2 altmetric
037 _ _ |a PUBDB-2017-07214
041 _ _ |a English
082 _ _ |a 530
088 1 _ |a CERN-PPE-96-124
088 _ _ |a CERN-PPE-96-124
|2 CERN
100 1 _ |a Acciarri, M.
|b 0
245 _ _ |a Measurement of the lifetime of the tau lepton
260 _ _ |a Amsterdam
|c 1996
|b North-Holland Publ.
336 7 _ |a article
|2 DRIVER
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Report
|0 PUB:(DE-HGF)29
|2 PUB:(DE-HGF)
|m report
336 7 _ |a Journal Article
|b journal
|m journal
|0 PUB:(DE-HGF)16
|s 1499763495_23766
|2 PUB:(DE-HGF)
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a Journal Article
|0 0
|2 EndNote
500 _ _ |a DESY-Zeuthen
520 _ _ |a The lifetime of the tau lepton is measured using data collected in 1994 by the L3 detector at LEP. The precise track position information of the Silicon Microvertex Detector is exploited. The tau lepton lifetime is determined from the signed impact parameter distribution for 30322 tau decays into one charged particle and from the decay length distribution for 3891 tau decays into three charged particles. Combining the two methods we obtain τ τ = 290.1 ± 4.0 fs.
536 _ _ |a 899 - ohne Topic (POF3-899)
|0 G:(DE-HGF)POF3-899
|c POF3-899
|f POF III
|x 0
588 _ _ |a Dataset connected to CrossRef, INSPIRE
650 _ 7 |a electron positron: colliding beams
|2 INSPIRE
650 _ 7 |a electron positron: annihilation
|2 INSPIRE
650 _ 7 |a Z0: electroproduction
|2 INSPIRE
650 _ 7 |a tau: pair production
|2 INSPIRE
650 _ 7 |a tau: decay modes
|2 INSPIRE
650 _ 7 |a tau: lifetime
|2 INSPIRE
650 _ 7 |a final state: (3charged particle)
|2 INSPIRE
650 _ 7 |a final state: (1charged particle)
|2 INSPIRE
650 _ 7 |a decay: path length
|2 INSPIRE
650 _ 7 |a track data analysis: impact parameter
|2 INSPIRE
650 _ 7 |a semiconductor detector: vertex
|2 INSPIRE
650 _ 7 |a L3
|2 INSPIRE
650 _ 7 |a experimental results
|2 INSPIRE
650 _ 7 |a CERN LEP Stor
|2 INSPIRE
650 _ 7 |a approx. 91 GeV-cms
|2 INSPIRE
693 _ _ |0 EXP:(DE-MLZ)NOSPEC-20140101
|5 EXP:(DE-MLZ)NOSPEC-20140101
|e No specific instrument
|x 0
700 1 _ |a Adriani, O.
|b 1
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|b 2
700 1 _ |a Ahlen, S. P.
|b 3
700 1 _ |a Alpat, B.
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700 1 _ |a Battiston, R.
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700 1 _ |a Hebbeker, T.
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700 1 _ |a van Hoek, W. C.
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700 1 _ |a Hofer, H.
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700 1 _ |a Hou, S. R.
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700 1 _ |a Innocente, V.
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700 1 _ |a Janssen, H.
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700 1 _ |a Jin, B. N.
|b 184
700 1 _ |a Jones, Lawrence W.
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700 1 _ |a Kapinos, P.
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700 1 _ |a Kunin, A.
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|b 215
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|b 219
700 1 _ |a Lebedev, A.
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700 1 _ |a Lee, J. S.
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700 1 _ |a Lee, K. Y.
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700 1 _ |a Levchenko, P.
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700 1 _ |a Lin, W. T.
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700 1 _ |a Lu, W.
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700 1 _ |a Lu, Y. S.
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700 1 _ |a Luci, C.
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700 1 _ |a Luckey, David
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700 1 _ |a Mihul, A.
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700 1 _ |a Petrak, S.
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700 1 _ |a Pevsner, A.
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700 1 _ |a Piccolo, D.
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700 1 _ |a Produit, N.
|b 313
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700 1 _ |a Rahal-Callot, G.
|b 315
700 1 _ |a Rancoita, P. G.
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700 1 _ |a Rattaggi, M.
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|b 336
700 1 _ |a Rosselet, Ph.
|b 337
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|b 338
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|0 INSPIRE-00121395
|b 339
700 1 _ |a Rubio, J. A.
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700 1 _ |a Salicio, J.
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700 1 _ |a Schmidt-Karst, S.
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700 1 _ |a Schmitz, D.
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700 1 _ |a Schmitz, P.
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|b 392
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|b 394
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|b 395
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|b 396
700 1 _ |a Toth, J.
|b 397
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