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@ARTICLE{Tuominen:330165,
      author       = {Tuominen, M. and Prieur, E. and Yakimova, R. and Glass, R.
                      C. and Tuomi, T. and Janzén, E.},
      title        = {{D}efect analysis in {L}ely-grown 6{H} {S}i{C}},
      journal      = {Journal of crystal growth},
      volume       = {165},
      number       = {3},
      issn         = {0022-0248},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier},
      reportid     = {PUBDB-2017-06678},
      pages        = {233 - 244},
      year         = {1996},
      note         = {F-Bereich; HASYLAB},
      abstract     = {Two Lely-grown 6H polytype SiC platelets were investigated
                      in terms of their crystalline quality and defect
                      characteristics. Synchrotron X-ray topography, along with
                      optical microscopy and high-resolution X-ray diffractometry
                      were used as characterization techniques. In the first
                      platelet a distored area where the nucleation has started
                      was observed. It consists of micropipes and a complex
                      network of the Frank-Read dislocation loops. Their Burgers
                      vectors were completely determined by X-ray topographic
                      analysis. Outside the distorted area the only large defects
                      observed were dislocations with a low density (in the order
                      of 102 cm−2) and few stacking faults. The quality of this
                      platelet has improved during the growth. The second platelet
                      was found to be of an excellent crystalline quality. It does
                      not contain micropipes or stacking faults and its
                      dislocation density is very low (about 30 cm−2). The
                      rocking curve widths (FWHM) of both samples were very narrow
                      (from 5.8″ to 8.3″). Possible relationships between the
                      observed defects and their formation mechanisms in the
                      growth processes are discussed.},
      cin          = {DESY(-2012)},
      ddc          = {540},
      cid          = {$I:(DE-H253)DESY_-2012_-20170516$},
      pnm          = {899 - ohne Topic (POF3-899)},
      pid          = {G:(DE-HGF)POF3-899},
      experiment   = {EXP:(DE-MLZ)NOSPEC-20140101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:A1996UZ46000006},
      doi          = {10.1016/0022-0248(96)00188-1},
      url          = {https://bib-pubdb1.desy.de/record/330165},
}