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000324653 1001_ $$0P:(DE-HGF)0$$aNichols, M. C.$$b0
000324653 245__ $$aSynchrotron microtomography of supported catalysts
000324653 260__ $$a[S.l.]$$bAmerican Institute of Physics$$c1989
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000324653 520__ $$aSynchrotron microtomography is a new technique which is capable of elemental, chemical, and structure sensitive imaging in three dimensions at resolutions better than 15 μm. This paper describes the first application of this new technique to the investigation of the morphology and elemental distribution of a supported catalyst. Using this new tool it was possible to obtain three‐dimensional information from regions of the catalyst away from the vicinity of the damaged surface region of the sample. The technique allows the use of both computed tomographic (CT) cross sections as well as the development of a three‐dimensional rendering of elements in a material, each of which allows visualization of different areas that would go unnoticed in normal radiographic or CT investigations.
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000324653 7001_ $$0P:(DE-HGF)0$$aKinney, J. H.$$b1
000324653 7001_ $$0P:(DE-HGF)0$$aJohnson, Q. C.$$b2
000324653 7001_ $$0P:(DE-HGF)0$$aSaroyan, R. A.$$b3
000324653 7001_ $$0P:(DE-H253)PIP1019167$$aBonse, U.$$b4
000324653 7001_ $$0P:(DE-HGF)0$$aNusshardt, R.$$b5
000324653 7001_ $$0P:(DE-H253)PIP1003461$$aPahl, R.$$b6
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