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@PHDTHESIS{Volkov:320084,
author = {Volkov, Sergey},
othercontributors = {Stierle, Andreas},
title = {{O}perando {X}-ray {I}nvestigation of {S}olid {O}xide
{F}uel {C}ell {M}odel {E}lectrodes},
school = {Universität Hamburg},
type = {Dr.},
address = {Hamburg},
publisher = {Verlag Deutsches Elektronen-Synchrotron},
reportid = {PUBDB-2017-01522, DESY-THESIS-2017-011},
series = {DESY-THESIS},
pages = {120},
year = {2017},
note = {Universität Hamburg, Diss., 2016},
abstract = {A detailed study of three solid oxide fuel cells (SOFCs)
related model systems is presented in this work with the aim
of the better understanding of the structural changes in
cell components associated with their operation. The first
model system is an La$_{0.6}$Sr$_{0.4}$CoO$_{3−δ}$ (LSC)
on yttria-stabilized zirconia (YSZ). Changes in the YSZ(100)
single crystal surface structure buried under the squared
LSC microelectrode were studied at a synchrotron under
operational conditions. High flux photon beam at the
synchrotron allowed access to the LSC/YSZ interface.
Structural information from the substrate surface at an
atomic scale was acquired. Element-specific anomalous XRD
data allowed to distinguish between Y and Zr scattering
contributions. For the first time, it was shown that the Y
cation concentration at the electrode/elec- trolyte
interface strongly depends on the sample environment and the
applied potential. The second model system is a Pt/YSZ.
Buried YSZ(111) surface and dense Pt film morphology changes
under operational conditions were addressed. High-energy
X-rays were necessary to collect surface-sensitive
information from the interface due to highly absorbing Pt
film. The main conclusion is - under conditions applied, the
YSZ single crystal surface remains stable at an atomic
level. A nagging topic of the Pt "phase oxide" formation at
the Pt/YSZ interface during anodic polarization was also
raised. Although XRD data did not show a clear evidence of
PtO x presence at the interface, energy- dispersive X-ray
analysis of the film cross-cut profile after the synchrotron
experiment revealed distinct oxygen signal from delaminated
parts of the film. Last but not least, the structure of a
ZrO$_2$ ultrathin film grown on a Pt$_3$ Zr(0001) single
crystal was studied in ultra-high vacuum for the first time
be means of SXRD. This model system is aiming to improve
understanding of the electrolyte materials based on ZrO$_2$
(e.g. YSZ) at an atomic level. The results obtained, can be
summarized as follows: the oxide film is not stable at the
oxygen pressure higher than 10$^{−6}$mbar; the
density-functional theory models tend to overestimate the
film-substrate distance; there is more than 1ML of a
reconstructed Pt present in the top-most layer of the
Pt$_3$Zr(0001) beneath the zirconia film.},
cin = {FS-NL / DOOR},
cid = {I:(DE-H253)FS-NL-20120731 / I:(DE-H253)HAS-User-20120731},
pnm = {6213 - Materials and Processes for Energy and Transport
Technologies (POF3-621)},
pid = {G:(DE-HGF)POF3-6213},
experiment = {EXP:(DE-H253)Nanolab-03-20150101 /
EXP:(DE-H253)Nanolab-01-20150101 /
EXP:(DE-H253)Nanolab-02-20150101},
typ = {PUB:(DE-HGF)3 / PUB:(DE-HGF)29 / PUB:(DE-HGF)11},
doi = {10.3204/PUBDB-2017-01522},
url = {https://bib-pubdb1.desy.de/record/320084},
}