TY  - JOUR
AU  - Patommel, Jens
AU  - Klare, Susanne
AU  - Hoppe, Robert
AU  - Ritter, Stephan
AU  - Samberg, Dirk
AU  - Wittwer, Felix
AU  - Jahn, Andreas
AU  - Richter, Karola
AU  - Wenzel, Christian
AU  - Bartha, Johann W.
AU  - Scholz, Maria
AU  - Seiboth, Frank
AU  - Boesenberg, Ulrike
AU  - Falkenberg, Gerald
AU  - Schroer, Christian G.
TI  - Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses
JO  - Applied physics letters
VL  - 110
IS  - 10
SN  - 1077-3118
CY  - Melville, NY
PB  - American Inst. of Physics
M1  - PUBDB-2017-01321
SP  - 101103 
PY  - 2017
N1  - Verbundprojekte konnten oben nicht angegeben werden: 05K10OD1, 05K13OD4
AB  - In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection [Bergemann et al., Phys. Rev. Lett. 91, 204801 (2003)], the concept of adiabatically focusing refractive lenses was proposed to overcome this limit [Schroer and Lengeler, Phys. Rev. Lett. 94, 054802 (2005)]. We present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10<sup>−3</sup> that clearly exceeds the critical angle of total reflection of 1.55 mrad.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000397871800003
DO  - DOI:10.1063/1.4977882
UR  - https://bib-pubdb1.desy.de/record/318671
ER  -