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024 7 _ |a 1089-7690
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041 _ _ |a English
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100 1 _ |a Piarristeguy, A. A.
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245 _ _ |a Structural singularities in $\mathrm{Ge_{x}Te_{100−x}}$ films
260 _ _ |a Melville, NY
|c 2015
|b American Institute of Physics
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520 _ _ |a Structural and calorimetric investigation of Ge$_{x}$Te$_{100−x}$ films over wide range of concentration 10 < x < 50 led to evidence two structural singularities at x ~ 22 at. % and x ~ 33-35 at. %. Analysis of bond distribution, bond variability, and glass thermal stability led to conclude to the origin of the first singularity being the flexible/rigid transition proposed in the framework of rigidity model and the origin of the second one being the disappearance of the undercooled region resulting in amorphous materials with statistical distributions of bonds. While the first singularity signs the onset of the Ge–Ge homopolar bonds, the second is related to compositions where enhanced Ge–Ge correlations at intermediate lengthscales (7.7 Å) are observed. These two threshold compositions correspond to recently reported resistance drift threshold compositions, an important support for models pointing the breaking of homopolar Ge–Ge bonds as the main phenomenon behind the ageing of phase change materials.
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700 1 _ |a Micoulaut, M.
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700 1 _ |a Escalier, R.
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773 _ _ |a 10.1063/1.4928504
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