TY  - JOUR
AU  - Wrobel, Pawel
AU  - Wegrzynek, Dariusz
AU  - Czyzycki, Mateusz
AU  - Lankosz, Marek
TI  - Depth Profiling of Element Concentrations in Stratified Materials by Confocal Microbeam X-ray Fluorescence Spectrometry with Polychromatic Excitation
JO  - Analytical chemistry
VL  - 86
IS  - 22
SN  - 1520-6882
CY  - Columbus, Ohio
PB  - American Chemical Society
M1  - PUBDB-2015-01288
SP  - 11275 - 11280
PY  - 2014
N1  - (c) American Chemical Society. Post referee full text in progress.
AB  - The confocal microbeam X-ray fluorescence technique is a well-established analytical tool that is widely used for qualitative and quantitative analysis of stratified materials. There are several different reconstruction methods dedicated to this type of samples. However, these methods are applicable with monochromatic excitation only. The full description of matrix effects and geometrical effects for polychromatic X-ray photons in confocal geometry is a demanding task. In the present paper, this problem was overcome by the use of effective energy approximation. The reduction of the whole energy dimension into one effective value eliminates the necessity of integration over the primary beam energy range for a number of basic parameters. This simplification is attainable without loss of the accuracy of analysis. The proposed approach was validated by applying it to the reconstruction of element concentration depth profiles of stratified standard samples measured with tabletop confocal microbeam X-ray fluorescence setup and by comparing the obtained results of two independent algorithms.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000345263300042
C6  - pmid:25307861
DO  - DOI:10.1021/ac502897g
UR  - https://bib-pubdb1.desy.de/record/207305
ER  -