TY  - JOUR
AU  - Decker, F.-J.
AU  - Ding, Y.
AU  - Dolgashev, V. A.
AU  - Frisch, J.
AU  - Krejcik, P.
AU  - Loos, H.
AU  - Lutman, A.
AU  - Maxwell, T. J.
AU  - Turner, J.
AU  - Wang, M.-H.
AU  - Behrens, Christopher
AU  - Huang, Z.
AU  - Wang, J.
AU  - Welch, J.
AU  - Wu, J.
TI  - Few-Femtosecond Time-Resolved Measurements of X-ray Free-Electron Lasers
JO  - Nature Communications
VL  - 5
SN  - 2041-1723
CY  - London
PB  - Nature Publishing Group
M1  - PUBDB-2015-01194
SP  - 3762
PY  - 2014
N1  - (c) Macmillan Publishers Limited. Post referee full text in progress.
AB  - X-ray free-electron lasers, with pulse durations ranging from a few to several hundred femtoseconds, are uniquely suited for studying atomic, molecular, chemical and biological systems. Characterizing the temporal profiles of these femtosecond X-ray pulses that vary from shot to shot is not only challenging but also important for data interpretation. Here we report the time-resolved measurements of X-ray free-electron lasers by using an X-band radiofrequency transverse deflector at the Linac Coherent Light Source. We demonstrate this method to be a simple, non-invasive technique with a large dynamic range for single-shot electron and X-ray temporal characterization. A resolution of less than 1 fs root mean square has been achieved for soft X-ray pulses. The lasing evolution along the undulator has been studied with the electron trapping being observed as the X-ray peak power approaches 100 GW.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000335224400003
C6  - pmid:24781868
DO  - DOI:10.1038/ncomms4762
UR  - https://bib-pubdb1.desy.de/record/207211
ER  -