%0 Journal Article
%A Decker, F.-J.
%A Ding, Y.
%A Dolgashev, V. A.
%A Frisch, J.
%A Krejcik, P.
%A Loos, H.
%A Lutman, A.
%A Maxwell, T. J.
%A Turner, J.
%A Wang, M.-H.
%A Behrens, Christopher
%A Huang, Z.
%A Wang, J.
%A Welch, J.
%A Wu, J.
%T Few-Femtosecond Time-Resolved Measurements of X-ray Free-Electron Lasers
%J Nature Communications
%V 5
%@ 2041-1723
%C London
%I Nature Publishing Group
%M PUBDB-2015-01194
%P 3762
%D 2014
%Z (c) Macmillan Publishers Limited. Post referee full text in progress.
%X X-ray free-electron lasers, with pulse durations ranging from a few to several hundred femtoseconds, are uniquely suited for studying atomic, molecular, chemical and biological systems. Characterizing the temporal profiles of these femtosecond X-ray pulses that vary from shot to shot is not only challenging but also important for data interpretation. Here we report the time-resolved measurements of X-ray free-electron lasers by using an X-band radiofrequency transverse deflector at the Linac Coherent Light Source. We demonstrate this method to be a simple, non-invasive technique with a large dynamic range for single-shot electron and X-ray temporal characterization. A resolution of less than 1 fs root mean square has been achieved for soft X-ray pulses. The lasing evolution along the undulator has been studied with the electron trapping being observed as the X-ray peak power approaches 100 GW.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000335224400003
%$ pmid:24781868
%R 10.1038/ncomms4762
%U https://bib-pubdb1.desy.de/record/207211