% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@INPROCEEDINGS{Roth:206992,
author = {Roth, Thomas and Helfen, Lukas and Hallmann, Joerg and
Samoylova, Liubov and Kwaśniewski, Paweł and Lengeler,
Bruno and Madsen, Anders},
editor = {Morawe, Christian and Goto, Shunji and Khounsary, Ali M.},
title = {{X}-ray {L}aminography and {SAXS} on {B}eryllium {G}rades
and {L}enses and {W}avefront {P}ropagation through
{I}mperfect {C}ompound {R}efractive {L}enses},
volume = {9207},
reportid = {PUBDB-2015-01039},
series = {Advances in X-Ray/EUV Optics and Components IX},
pages = {920702-1 -- 920702-12},
year = {2014},
comment = {Proc. SPIE 9207, Advances in X-Ray/EUV Optics and
Components IX},
booktitle = {Proc. SPIE 9207, Advances in X-Ray/EUV
Optics and Components IX},
abstract = {Hard X-ray free electron lasers provide almost fully
transverse coherent X-rays. Though the natural divergence of
these X-rays is a few micro-radians, they still need to be
collimated or focused while traveling up to 1km towards the
sample. This can be done with beryllium compound refractive
lenses (CRLs). Due to the coherence of the beam, it is
important that the impurities or granular boundaries in
these CRLs do not distort the wavefront of the X-ray beam to
a measurable extend. We measured the SAXS signal of various
beryllium grades and of 2D parabolic lenses made of IF-1
beryllium. Then, we imaged these samples using X-ray
computed laminography at a resolution of around 1
micrometer. Computed laminography is a 3D imaging technique
similar to computed tomography, but particularly adapted for
at extended objects. These measurements are used to
characterize the voids and granular boundaries in the
beryllium samples. Boundaries between the former powder
particles are easily seen for beryllium grades produced via
powder metallurgy methods. This is not the case for cast
ingots. Common to all samples are voids with diameters in
the 10 micrometer range as well as smaller sized, denser
impurities. Finally, we use wavefront propagation
simulations in order to analyze the effect of voids in the
CRLs on the wavefront of the XFEL beam. If the distance
"lens to focus and sample" is large enough, the diffraction
patterns emerging from the voids smoothen out},
month = {Aug},
date = {2014-08-17},
organization = {SPIE Optical Engineering +
Applications, San Diego (California),
17 Aug 2014 - 17 Aug 2014},
cin = {Eur.XFEL},
cid = {$I:(DE-H253)Eur_XFEL-20120731$},
pnm = {Facility (machine) XFEL (POF2-XFEL-20130405)},
pid = {G:(DE-H253)POF2-XFEL-20130405},
experiment = {EXP:(DE-H253)XFEL(machine)-20150101 /
EXP:(DE-H253)XFEL-MID-20150101},
typ = {PUB:(DE-HGF)8},
UT = {WOS:000343877600002},
doi = {10.1117/12.2061127},
url = {https://bib-pubdb1.desy.de/record/206992},
}