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000206517 1001_ $$0P:(DE-H253)PIP1017972$$aUhlén, Fredrik$$b0$$eCorresponding Author
000206517 245__ $$aRonchi test for Characterization of X-ray Nanofocusing Optics and Beamlines
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000206517 520__ $$aA Ronchi interferometer for hard X-rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the detector gives information on the degree of spatial coherence in the beamline. This enables the possibility to detect sources of instabilities in the beamline like vibrations of components or temperature drift. Examples are shown for two different nanofocusing hard X-ray optics: a compound refractive lens and a zone plate.
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000206517 536__ $$0G:(DE-H253)BMBF-05K13OD2$$a05K13OD2 - Erzeugung und Charakterisierung von nanofokussierten XFEL-Pulsen zur Abbildung ultraschneller Prozesse in Materie (BMBF-05K13OD2)$$cBMBF-05K13OD2$$x3
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000206517 7001_ $$0P:(DE-HGF)0$$aRahomäki, Jussi$$b1
000206517 7001_ $$0P:(DE-H253)PIP1017968$$aNilsson, Daniel$$b2
000206517 7001_ $$0P:(DE-HGF)0$$aSeiboth, Frank$$b3
000206517 7001_ $$0P:(DE-HGF)0$$aSanz, Claude$$b4
000206517 7001_ $$0P:(DE-HGF)0$$aWagner, Ulrich$$b5
000206517 7001_ $$0P:(DE-HGF)0$$aRau, Christoph$$b6
000206517 7001_ $$0P:(DE-H253)PIP1008438$$aSchroer, Christian$$b7$$udesy
000206517 7001_ $$0P:(DE-H253)PIP1017886$$aVogt, Ulrich$$b8
000206517 773__ $$0PERI:(DE-600)2021413-3$$a10.1107/S160057751401323X$$gVol. 21, no. 5, p. 1105 - 1109$$n5$$p1105 - 1109$$tJournal of synchrotron radiation$$v21$$x1600-5775$$y2014
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