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@INPROCEEDINGS{Wessels:168481,
      author       = {Wessels, Philipp and Ewald, Johannes and Wieland, Marek and
                      Nisius, Thomas and Abbati, Gennaro and Baumbach, Stefan and
                      Overbuschmann, Johannes and Vogel, Andreas and Neumann,
                      Alexander and Viefhaus, Jens and Oepen, Hans Peter and
                      Meier, Guido and Wilhein, Thomas and Drescher, Markus},
      title        = {{T}ime-resolved soft {X}-ray microscopy of magnetic
                      nanostructures at the {P}04 beamline at {PETRA} {III}},
      journal      = {Journal of physics / Conference Series},
      volume       = {499},
      number       = {1},
      issn         = {1742-6596},
      address      = {Bristol},
      publisher    = {IOP Publ.},
      reportid     = {DESY-2014-02570},
      pages        = {012009},
      year         = {2014},
      note         = {(c) the authors. Open Access.},
      abstract     = {We present first time-resolved measurements of a new mobile
                      full-field transmission microscope obtained at the soft
                      X-ray beamline P04 at the high brilliance synchrotron
                      radiation source PETRA III.A nanostructured magnetic
                      permalloy (Ni80Fe20) sample can be excited by the magnetic
                      field of a 400 ps full width at half maximum (FWHM) long
                      electric current pulse in a coplanar waveguide. The
                      full-field soft X-ray microscope successively probes the
                      time evolution of the sample magnetization via X-ray
                      magnetic circular dichroism (XMCD) spectromicroscopy in a
                      pump-probe scheme by varying the delay between pump and
                      probe pulses electronically. Static and transient magnetic
                      fields of a permanent magnet and a coil are available in the
                      sample plane to reset the system and to provide external
                      offset fields.The microscope generates a flat-top
                      illumination field of 20 µm diameter by using a grating
                      condenser and the sample plane is directly imaged by a micro
                      zone plate with 60 nm resolution onto a 2D gateable X-ray
                      detector to select the particular bunch in the storage ring
                      that contains the dynamic information. The setup is built
                      into a mobile endstation vacuum system with in-house
                      developed three-axis piezo motorized stages for high
                      accuracy positioning of all microscopy-components inside the
                      chambers.},
      month         = {Sep},
      date          = {2013-09-02},
      organization  = {22nd International Congress on X-ray
                       Optics and Microanalysis, Hamburg
                       (Germany), 2 Sep 2013 - 6 Sep 2013},
      cin          = {UNI/EXP / FS-PE / DOOR},
      ddc          = {530},
      cid          = {$I:(DE-H253)UNI_EXP-20120731$ / I:(DE-H253)FS-PE-20120731 /
                      I:(DE-H253)HAS-User-20120731},
      pnm          = {PETRA Beamline P04 (POF2-54G14) / FS-Proposal: I-20120127
                      (I-20120127)},
      pid          = {G:(DE-H253)POF2-P04-20130405 / G:(DE-H253)I-20120127},
      experiment   = {EXP:(DE-H253)P-P04-20150101},
      typ          = {PUB:(DE-HGF)8 / PUB:(DE-HGF)16},
      UT           = {WOS:000338041300009},
      doi          = {10.1088/1742-6596/499/1/012009},
      url          = {https://bib-pubdb1.desy.de/record/168481},
}