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| 001 | 167779 | ||
| 005 | 20250730152351.0 | ||
| 024 | 7 | _ | |a 10.1038/nature12449 |2 doi |
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| 100 | 1 | _ | |a Beye, M. |0 P:(DE-H253)PIP1005334 |b 0 |e Corresponding author |
| 245 | _ | _ | |a Stimulated X-ray emission for materials science |
| 260 | _ | _ | |a London |c 2013 |b Macmillan28177 |
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| 520 | _ | _ | |a Resonant inelastic X-ray scattering and X-ray emission spectroscopy can be used to probe the energy and dispersion of the elementary low-energy excitations that govern functionality in matter: vibronic, charge, spin and orbital excitations. A key drawback of resonant inelastic X-ray scattering has been the need for high photon densities to compensate for fluorescence yields of less than a per cent for soft X-rays8. Sample damage from the dominant non-radiative decays thus limits the materials to which such techniques can be applied and the spectral resolution that can be obtained. A means of improving the yield is therefore highly desirable. Here we demonstrate stimulated X-ray emission for crystalline silicon at photon densities that are easily achievable with free-electron lasers. The stimulated radiative decay of core excited species at the expense of non-radiative processes reduces sample damage and permits narrow-bandwidth detection in the directed beam of stimulated radiation. We deduce how stimulated X-ray emission can be enhanced by several orders of magnitude to provide, with high yield and reduced sample damage, a superior probe for low-energy excitations and their dispersion in matter. This is the first step to bringing nonlinear X-ray physics in the condensed phase from theory to application. |
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| 773 | _ | _ | |a 10.1038/nature12449 |g Vol. 501, no. 7466, p. 191 - 194 |0 PERI:(DE-600)1413423-8 |n 7466 |p 191 - 194 |t Nature |v 501 |y 2013 |x 1476-4687 |
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