TY  - JOUR
AU  - Beye, M.
AU  - Schreck, S.
AU  - Sorgenfrei, F.
AU  - Trabant, C.
AU  - Pontius, N.
AU  - Schüßler-Langeheine, C.
AU  - Wurth, W.
AU  - Föhlisch, A.
TI  - Stimulated X-ray emission for materials science
JO  - Nature
VL  - 501
IS  - 7466
SN  - 1476-4687
CY  - London
PB  - Macmillan28177
M1  - DESY-2014-02110
SP  - 191 - 194
PY  - 2013
N1  - © Macmillan Publishers Limited.
AB  - Resonant inelastic X-ray scattering and X-ray emission spectroscopy can be used to probe the energy and dispersion of the elementary low-energy excitations that govern functionality in matter: vibronic, charge, spin and orbital excitations. A key drawback of resonant inelastic X-ray scattering has been the need for high photon densities to compensate for fluorescence yields of less than a per cent for soft X-rays8. Sample damage from the dominant non-radiative decays thus limits the materials to which such techniques can be applied and the spectral resolution that can be obtained. A means of improving the yield is therefore highly desirable. Here we demonstrate stimulated X-ray emission for crystalline silicon at photon densities that are easily achievable with free-electron lasers. The stimulated radiative decay of core excited species at the expense of non-radiative processes reduces sample damage and permits narrow-bandwidth detection in the directed beam of stimulated radiation. We deduce how stimulated X-ray emission can be enhanced by several orders of magnitude to provide, with high yield and reduced sample damage, a superior probe for low-energy excitations and their dispersion in matter. This is the first step to bringing nonlinear X-ray physics in the condensed phase from theory to application.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000324244900034
C6  - pmid:23965622
DO  - DOI:10.1038/nature12449
UR  - https://bib-pubdb1.desy.de/record/167779
ER  -