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000167779 1001_ $$0P:(DE-H253)PIP1005334$$aBeye, M.$$b0$$eCorresponding author
000167779 245__ $$aStimulated X-ray emission for materials science
000167779 260__ $$aLondon$$bMacmillan28177$$c2013
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000167779 520__ $$aResonant inelastic X-ray scattering and X-ray emission spectroscopy can be used to probe the energy and dispersion of the elementary low-energy excitations that govern functionality in matter: vibronic, charge, spin and orbital excitations. A key drawback of resonant inelastic X-ray scattering has been the need for high photon densities to compensate for fluorescence yields of less than a per cent for soft X-rays8. Sample damage from the dominant non-radiative decays thus limits the materials to which such techniques can be applied and the spectral resolution that can be obtained. A means of improving the yield is therefore highly desirable. Here we demonstrate stimulated X-ray emission for crystalline silicon at photon densities that are easily achievable with free-electron lasers. The stimulated radiative decay of core excited species at the expense of non-radiative processes reduces sample damage and permits narrow-bandwidth detection in the directed beam of stimulated radiation. We deduce how stimulated X-ray emission can be enhanced by several orders of magnitude to provide, with high yield and reduced sample damage, a superior probe for low-energy excitations and their dispersion in matter. This is the first step to bringing nonlinear X-ray physics in the condensed phase from theory to application.
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000167779 7001_ $$0P:(DE-H253)PIP1012147$$aSchreck, S.$$b1
000167779 7001_ $$0P:(DE-H253)PIP1006485$$aSorgenfrei, F.$$b2
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000167779 773__ $$0PERI:(DE-600)1413423-8$$a10.1038/nature12449$$gVol. 501, no. 7466, p. 191 - 194$$n7466$$p191 - 194$$tNature$$v501$$x1476-4687$$y2013
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