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ZEU-XFEL
XFEL Also known as:XFEL ZeuthenID | I:(DE-H253)ZEU-XFEL-20120731 |
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Master Thesis
Entwicklung eines kompakten Ionisationsprofilmonitors(3D-IPM) zur Online-Bestimmung von Profil und Positioneines Röntgenlaserstrahls
Deutsches Elektronen-Synchrotron 195 pp. (2017) [10.3204/PUBDB-2017-06508] = Beuth Hochschule für Technik Berlin, Masterarbeit, 2017
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Report/Journal Article
Characterization studies of silicon photomultipliers and crystals matrices for a novel time of flight PET detector
Journal of Instrumentation 10(06), P06009 (2015) [10.1088/1748-0221/10/06/P06009]
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Fulltext by arXiv.org
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Conference Presentation
New compact design of a three-dimensional ionization profile monitor (IPM)
International Beam Position Instrumentation Conference, OxfordOxford, United Kingdom, 16 Sep 2014 - 19 Sep 2014
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Conference Presentation
An electron beam detector for the FLASH II beam dump
SPIE Optics + Photonics 2013, SPIE2013, PraguePrague, Czech Republic, 15 Apr 2013 - 18 Apr 2014
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Conference Presentation
A FAST SWITCHING MIRROR UNIT AT FLASH
International Beam Instrumentation 2013, IBIC 2013, OxfordOxford, United Kingdom, 16 Sep 2013 - 19 Sep 2013
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Conference Presentation
AN ELECTRON BEAM DETECTOR FOR THE FLASH II BEAM DUMP
International Beam Instrumentation 2013, IBIC 2013, OxfordOxford, United Kingdom, 16 Sep 2013 - 19 Sep 2013
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Conference Presentation
A new compact Design of a three-dimensional Ionization Profile Monitor (IPM)
SPIE Optics + Optoelectronics: Advances in X-ray Free-Electron Laser Instrumentation, PraguePrague, Czech Republic, 15 Apr 2013 - 18 Apr 2013
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Bachelor Thesis/Report
Durchführbarkeitsstudien zur direkten Drahtauslese an Wirescannern in Elektronen-Beschleunigern
Hamburg : Deutsches Elektronen-Synchrotron, DESY 91 pp. (2010) [10.3204/DESY-THESIS-2010-040] = Hochschule Lausitz, Bachelorarbeit, 2010
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All known publications ...
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