001     151996
005     20250718135758.0
024 7 _ |a 10.1117/12.930075
|2 doi
024 7 _ |a WOS:000311837900002
|2 WOS
024 7 _ |a inspire:1358100
|2 inspire
024 7 _ |a openalex:W2056376519
|2 openalex
037 _ _ |a PHPPUBDB-26573
041 _ _ |a English
100 1 _ |a Loh, N. D.
|b 0
110 1 _ |a DESY
|b CFEL Publications
111 2 _ |a X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
|c San Diego
|d 2012-08-13 - 2012-08-16
|w USA
245 _ _ |a Profiling structured beams using injected aerosols
260 _ _ |a San Diego
|c 2012
|b SPIE
295 1 0 |a X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
300 _ _ |a 850403
336 7 _ |a CONFERENCE_PAPER
|2 ORCID
336 7 _ |a Conference Paper
|0 33
|2 EndNote
336 7 _ |a INPROCEEDINGS
|2 BibTeX
336 7 _ |a conferenceObject
|2 DRIVER
336 7 _ |a Output Types/Conference Paper
|2 DataCite
336 7 _ |a Contribution to a conference proceedings
|b contrib
|m contrib
|0 PUB:(DE-HGF)8
|s 1490104716_32241
|2 PUB:(DE-HGF)
336 7 _ |a Contribution to a book
|0 PUB:(DE-HGF)7
|2 PUB:(DE-HGF)
|m contb
440 _ 0 |a X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
|v 8540
500 _ _ |3 Converted on 2013-05-30 10:12
500 _ _ |3 Converted on 2013-06-21 19:21
520 _ _ |a Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.
536 _ _ |a XFEL In-house research / external facilities (POF2-54G17)
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536 _ _ |a Experiments at CFEL (POF2-544)
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693 _ _ |0 EXP:(DE-MLZ)External-20140101
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700 1 _ |a Starodub, D.
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700 1 _ |a Lomb, L.
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700 1 _ |a Hampton, C. Y.
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700 1 _ |a Martin, A. V.
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700 1 _ |a Sierra, R. G.
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700 1 _ |a Barty, A.
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700 1 _ |a Aquila, A.
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700 1 _ |a Schulz, J.
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700 1 _ |a Steinbrener, J.
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700 1 _ |a Shoeman, R. L.
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700 1 _ |a Kassemeyer, S.
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700 1 _ |a Bostedt, C.
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700 1 _ |a Bozek, J.
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700 1 _ |a Epp, S. W.
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700 1 _ |a Erk, B.
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700 1 _ |a Hartmann, R.
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700 1 _ |a Rolles, D.
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700 1 _ |a Rudenko, A.
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700 1 _ |a Rudek, B.
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700 1 _ |a Foucar, L.
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700 1 _ |a Kimmel, N.
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700 1 _ |a Weidenspointner, G.
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700 1 _ |a Hauser, G.
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700 1 _ |a Holl, P.
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700 1 _ |a Pedersoli, E.
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700 1 _ |a Liang, M.
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700 1 _ |a Hunter, M. S.
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700 1 _ |a Gumprecht, L.
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700 1 _ |a Coppola, N.
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700 1 _ |a Wunderer, C.
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700 1 _ |a Graafsma, Heinz
|0 P:(DE-H253)PIP1005340
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700 1 _ |a Maia, F. R. N. C.
|b 32
700 1 _ |a Ekeberg, T.
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700 1 _ |a Hantke, M.
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700 1 _ |a Fleckenstein, H.
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700 1 _ |a Hirsemann, H.
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700 1 _ |a Nass, K.
|0 P:(DE-H253)PIP1009197
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700 1 _ |a White, T. A.
|b 38
700 1 _ |a Tobias, H. J.
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700 1 _ |a Farquar, G. R.
|b 40
700 1 _ |a Benner, W. H.
|b 41
700 1 _ |a Hau-Riege, S.
|0 P:(DE-H253)PIP1009875
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700 1 _ |a Reich, C.
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700 1 _ |a Hartmann, A.
|b 44
700 1 _ |a Soltau, H.
|b 45
700 1 _ |a Marchesini, S.
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700 1 _ |a Bajt, S.
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700 1 _ |a Barthelmess, M.
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700 1 _ |a Strueder, L.
|b 49
700 1 _ |a Ullrich, J.
|0 P:(DE-H253)PIP1008384
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700 1 _ |a Bucksbaum, P.
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700 1 _ |a Hodgson, K. O.
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700 1 _ |a Frank, M.
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700 1 _ |a Schlichting, I.
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700 1 _ |a Chapman, H. N.
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700 1 _ |a Bogan, M. J.
|b 56
700 1 _ |a Moeller, Stefan P.
|b 57
|e Editor
700 1 _ |a Yabashi, Makina
|b 58
|e Editor
700 1 _ |a Hau-Riege, Stefan P.
|b 59
|e Editor
909 C O |p VDB
|o oai:bib-pubdb1.desy.de:151996
910 1 _ |a Deutsches Elektronen-Synchrotron
|0 I:(DE-588b)2008985-5
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910 1 _ |a The European X-Ray Laser Project XFEL
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910 1 _ |a Externes Institut
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913 2 _ |a DE-HGF
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913 1 _ |b Struktur der Materie
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913 1 _ |b Struktur der Materie
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|0 G:(DE-HGF)POF2-544
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914 1 _ |y 2012
915 _ _ |a No Author Disambiguation
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920 _ _ |k 111
920 1 _ |0 I:(DE-H253)FS-CFEL-1-20120731
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920 1 _ |0 I:(DE-H253)FS-SCS-20131031
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980 _ _ |a contrib
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980 _ _ |a contb
980 _ _ |a I:(DE-H253)FS-CFEL-1-20120731
980 _ _ |a I:(DE-H253)FS-SCS-20131031
980 _ _ |a UNRESTRICTED


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