TY  - CONF
AU  - Loh, N. D.
AU  - Starodub, D.
AU  - Lomb, L.
AU  - Hampton, C. Y.
AU  - Martin, A. V.
AU  - Sierra, R. G.
AU  - Barty, A.
AU  - Aquila, A.
AU  - Schulz, J.
AU  - Steinbrener, J.
AU  - Shoeman, R. L.
AU  - Kassemeyer, S.
AU  - Bostedt, C.
AU  - Bozek, J.
AU  - Epp, S. W.
AU  - Erk, B.
AU  - Hartmann, R.
AU  - Rolles, D.
AU  - Rudenko, A.
AU  - Rudek, B.
AU  - Foucar, L.
AU  - Kimmel, N.
AU  - Weidenspointner, G.
AU  - Hauser, G.
AU  - Holl, P.
AU  - Pedersoli, E.
AU  - Liang, M.
AU  - Hunter, M. S.
AU  - Gumprecht, L.
AU  - Coppola, N.
AU  - Wunderer, C.
AU  - Graafsma, Heinz
AU  - Maia, F. R. N. C.
AU  - Ekeberg, T.
AU  - Hantke, M.
AU  - Fleckenstein, H.
AU  - Hirsemann, H.
AU  - Nass, K.
AU  - White, T. A.
AU  - Tobias, H. J.
AU  - Farquar, G. R.
AU  - Benner, W. H.
AU  - Hau-Riege, S.
AU  - Reich, C.
AU  - Hartmann, A.
AU  - Soltau, H.
AU  - Marchesini, S.
AU  - Bajt, S.
AU  - Barthelmess, M.
AU  - Strueder, L.
AU  - Ullrich, J.
AU  - Bucksbaum, P.
AU  - Hodgson, K. O.
AU  - Frank, M.
AU  - Schlichting, I.
AU  - Chapman, H. N.
AU  - Bogan, M. J.
AU  - DESY
A3  - Moeller, Stefan P.
A3  - Yabashi, Makina
A3  - Hau-Riege, Stefan P.
TI  - Profiling structured beams using injected aerosols
JO  - X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
VL  - 8540
CY  - San Diego
PB  - SPIE
M1  - PHPPUBDB-26573
SP  - 850403
PY  - 2012
AB  - Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied. 
T2  - X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
CY  - 13 Aug 2012 - 16 Aug 2012, San Diego (USA)
Y2  - 13 Aug 2012 - 16 Aug 2012
M2  - San Diego, USA
LB  - PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
UR  - <Go to ISI:>//WOS:000311837900002
DO  - DOI:10.1117/12.930075
UR  - https://bib-pubdb1.desy.de/record/151996
ER  -