000151996 001__ 151996
000151996 005__ 20250718135758.0
000151996 0247_ $$2doi$$a10.1117/12.930075
000151996 0247_ $$2WOS$$aWOS:000311837900002
000151996 0247_ $$2inspire$$ainspire:1358100
000151996 0247_ $$2openalex$$aopenalex:W2056376519
000151996 037__ $$aPHPPUBDB-26573
000151996 041__ $$aEnglish
000151996 1001_ $$aLoh, N. D.$$b0
000151996 1101_ $$aDESY$$bCFEL Publications
000151996 1112_ $$aX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications$$cSan Diego$$d2012-08-13 - 2012-08-16$$wUSA
000151996 245__ $$aProfiling structured beams using injected aerosols
000151996 260__ $$aSan Diego$$bSPIE$$c2012
000151996 29510 $$aX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
000151996 300__ $$a850403
000151996 3367_ $$2ORCID$$aCONFERENCE_PAPER
000151996 3367_ $$033$$2EndNote$$aConference Paper
000151996 3367_ $$2BibTeX$$aINPROCEEDINGS
000151996 3367_ $$2DRIVER$$aconferenceObject
000151996 3367_ $$2DataCite$$aOutput Types/Conference Paper
000151996 3367_ $$0PUB:(DE-HGF)8$$2PUB:(DE-HGF)$$aContribution to a conference proceedings$$bcontrib$$mcontrib$$s1490104716_32241
000151996 3367_ $$0PUB:(DE-HGF)7$$2PUB:(DE-HGF)$$aContribution to a book$$mcontb
000151996 440_0 $$aX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications$$v8540
000151996 500__ $$3Converted on 2013-05-30 10:12
000151996 500__ $$3Converted on 2013-06-21 19:21
000151996 520__ $$aProfiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied. 
000151996 536__ $$0G:(DE-H253)POF2-XFEL-in-house-20130405$$aXFEL In-house research / external facilities (POF2-54G17)$$cPOF2-54G17$$fPOF II$$x0
000151996 536__ $$0G:(DE-H253)POF2-CFEL-Exp.-20130405$$aExperiments at CFEL (POF2-544)$$cPOF2-544$$fPOF II$$x1
000151996 693__ $$0EXP:(DE-MLZ)External-20140101$$5EXP:(DE-MLZ)External-20140101$$eMeasurement at external facility$$x0
000151996 693__ $$0EXP:(DE-H253)CFEL-Exp-20150101$$5EXP:(DE-H253)CFEL-Exp-20150101$$eExperiments at CFEL$$x1
000151996 7001_ $$0P:(DE-H253)PIP1009124$$aStarodub, D.$$b1
000151996 7001_ $$0P:(DE-H253)PIP1008257$$aLomb, L.$$b2
000151996 7001_ $$aHampton, C. Y.$$b3
000151996 7001_ $$aMartin, A. V.$$b4
000151996 7001_ $$aSierra, R. G.$$b5
000151996 7001_ $$0P:(DE-H253)PIP1008245$$aBarty, A.$$b6$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1009066$$aAquila, A.$$b7
000151996 7001_ $$0P:(DE-H253)PIP1019553$$aSchulz, J.$$b8
000151996 7001_ $$0P:(DE-H253)PIP1014108$$aSteinbrener, J.$$b9
000151996 7001_ $$aShoeman, R. L.$$b10
000151996 7001_ $$0P:(DE-H253)PIP1013003$$aKassemeyer, S.$$b11
000151996 7001_ $$0P:(DE-H253)PIP1007475$$aBostedt, C.$$b12
000151996 7001_ $$0P:(DE-H253)PIP1009440$$aBozek, J.$$b13
000151996 7001_ $$aEpp, S. W.$$b14
000151996 7001_ $$0P:(DE-H253)PIP1011809$$aErk, B.$$b15$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1008172$$aHartmann, R.$$b16
000151996 7001_ $$0P:(DE-H253)PIP1007320$$aRolles, D.$$b17$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1006803$$aRudenko, A.$$b18
000151996 7001_ $$0P:(DE-H253)PIP1010962$$aRudek, B.$$b19
000151996 7001_ $$aFoucar, L.$$b20
000151996 7001_ $$0P:(DE-H253)PIP1008138$$aKimmel, N.$$b21
000151996 7001_ $$0P:(DE-H253)PIP1012764$$aWeidenspointner, G.$$b22
000151996 7001_ $$0P:(DE-H253)PIP1009777$$aHauser, G.$$b23
000151996 7001_ $$aHoll, P.$$b24
000151996 7001_ $$0P:(DE-H253)PIP1008690$$aPedersoli, E.$$b25
000151996 7001_ $$0P:(DE-H253)PIP1007507$$aLiang, M.$$b26$$udesy
000151996 7001_ $$aHunter, M. S.$$b27
000151996 7001_ $$0P:(DE-H253)PIP1002488$$aGumprecht, L.$$b28$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1002765$$aCoppola, N.$$b29
000151996 7001_ $$0P:(DE-H253)PIP1010727$$aWunderer, C.$$b30$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1005340$$aGraafsma, Heinz$$b31$$udesy
000151996 7001_ $$aMaia, F. R. N. C.$$b32
000151996 7001_ $$0P:(DE-H253)PIP1007725$$aEkeberg, T.$$b33$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1013117$$aHantke, M.$$b34
000151996 7001_ $$0P:(DE-H253)PIP1011659$$aFleckenstein, H.$$b35$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1002475$$aHirsemann, H.$$b36$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1009197$$aNass, K.$$b37$$udesy
000151996 7001_ $$aWhite, T. A.$$b38
000151996 7001_ $$aTobias, H. J.$$b39
000151996 7001_ $$aFarquar, G. R.$$b40
000151996 7001_ $$aBenner, W. H.$$b41
000151996 7001_ $$0P:(DE-H253)PIP1009875$$aHau-Riege, S.$$b42
000151996 7001_ $$0P:(DE-H253)PIP1010895$$aReich, C.$$b43
000151996 7001_ $$aHartmann, A.$$b44
000151996 7001_ $$aSoltau, H.$$b45
000151996 7001_ $$0P:(DE-H253)PIP1009088$$aMarchesini, S.$$b46
000151996 7001_ $$0P:(DE-H253)PIP1006443$$aBajt, S.$$b47$$udesy
000151996 7001_ $$0P:(DE-H253)PIP1005287$$aBarthelmess, M.$$b48$$udesy
000151996 7001_ $$aStrueder, L.$$b49
000151996 7001_ $$0P:(DE-H253)PIP1008384$$aUllrich, J.$$b50
000151996 7001_ $$0P:(DE-H253)PIP1009467$$aBucksbaum, P.$$b51
000151996 7001_ $$aHodgson, K. O.$$b52
000151996 7001_ $$0P:(DE-H253)PIP1009688$$aFrank, M.$$b53
000151996 7001_ $$0P:(DE-H253)PIP1008260$$aSchlichting, I.$$b54
000151996 7001_ $$0P:(DE-H253)PIP1006324$$aChapman, H. N.$$b55$$udesy
000151996 7001_ $$aBogan, M. J.$$b56
000151996 7001_ $$aMoeller, Stefan P.$$b57$$eEditor
000151996 7001_ $$aYabashi, Makina$$b58$$eEditor
000151996 7001_ $$aHau-Riege, Stefan P.$$b59$$eEditor
000151996 909CO $$ooai:bib-pubdb1.desy.de:151996$$pVDB
000151996 9101_ $$0I:(DE-588b)2008985-5$$aDeutsches Elektronen-Synchrotron$$kDESY
000151996 9101_ $$0I:(DE-588b)16047298-2$$aThe European X-Ray Laser Project XFEL$$kXFEL
000151996 9101_ $$0I:(DE-HGF)0$$aExternes Institut$$kExtern
000151996 9132_ $$0G:(DE-HGF)POF3-621$$1G:(DE-HGF)POF3-620$$2G:(DE-HGF)POF3-600$$9G:(DE-HGF)POF3-6215$$aDE-HGF$$bForschungsbereich Materie$$lVon Materie zu Materialien und Leben$$vIn-house research on the structure, dynamics and function of matter$$x0
000151996 9131_ $$0G:(DE-HGF)POF2-54G17$$1G:(DE-HGF)POF2-540$$2G:(DE-HGF)POF2-500$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$9G:(DE-H253)POF2-XFEL-in-house-20130405$$aDE-H253$$bStruktur der Materie$$lForschung mit Photonen, Neutronen, Ionen$$vDESY-participation in XFEL$$x0
000151996 9131_ $$0G:(DE-HGF)POF2-544$$1G:(DE-HGF)POF2-540$$2G:(DE-HGF)POF2-500$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$9G:(DE-H253)POF2-CFEL-Exp.-20130405$$aDE-H253$$bStruktur der Materie$$lForschung mit Photonen, Neutronen, Ionen$$vIn-house Research with PNI$$x1
000151996 9141_ $$y2012
000151996 915__ $$0StatID:(DE-HGF)1$$2StatID$$aNo Author Disambiguation
000151996 920__ $$k111
000151996 9201_ $$0I:(DE-H253)FS-CFEL-1-20120731$$kFS-CFEL-1$$lCFEL-Coherent X-Ray Imaging$$x0
000151996 9201_ $$0I:(DE-H253)FS-SCS-20131031$$kFS-SCS$$lStrukturdynamik Chemischer Systeme$$x1
000151996 920_1 $$iCFEL Publications$$kCFEL-DESY
000151996 980__ $$acontrib
000151996 980__ $$aVDB
000151996 980__ $$acontb
000151996 980__ $$aI:(DE-H253)FS-CFEL-1-20120731
000151996 980__ $$aI:(DE-H253)FS-SCS-20131031
000151996 980__ $$aUNRESTRICTED