%0 Conference Paper
%A Loh, N. D.
%A Starodub, D.
%A Lomb, L.
%A Hampton, C. Y.
%A Martin, A. V.
%A Sierra, R. G.
%A Barty, A.
%A Aquila, A.
%A Schulz, J.
%A Steinbrener, J.
%A Shoeman, R. L.
%A Kassemeyer, S.
%A Bostedt, C.
%A Bozek, J.
%A Epp, S. W.
%A Erk, B.
%A Hartmann, R.
%A Rolles, D.
%A Rudenko, A.
%A Rudek, B.
%A Foucar, L.
%A Kimmel, N.
%A Weidenspointner, G.
%A Hauser, G.
%A Holl, P.
%A Pedersoli, E.
%A Liang, M.
%A Hunter, M. S.
%A Gumprecht, L.
%A Coppola, N.
%A Wunderer, C.
%A Graafsma, Heinz
%A Maia, F. R. N. C.
%A Ekeberg, T.
%A Hantke, M.
%A Fleckenstein, H.
%A Hirsemann, H.
%A Nass, K.
%A White, T. A.
%A Tobias, H. J.
%A Farquar, G. R.
%A Benner, W. H.
%A Hau-Riege, S.
%A Reich, C.
%A Hartmann, A.
%A Soltau, H.
%A Marchesini, S.
%A Bajt, S.
%A Barthelmess, M.
%A Strueder, L.
%A Ullrich, J.
%A Bucksbaum, P.
%A Hodgson, K. O.
%A Frank, M.
%A Schlichting, I.
%A Chapman, H. N.
%A Bogan, M. J.
%A DESY
%Y Moeller, Stefan P.
%Y Yabashi, Makina
%Y Hau-Riege, Stefan P.
%T Profiling structured beams using injected aerosols
%J X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
%V 8540
%C San Diego
%I SPIE
%M PHPPUBDB-26573
%P 850403
%D 2012
%< X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
%X Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied. 
%B X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
%C 13 Aug 2012 - 16 Aug 2012, San Diego (USA)
Y2 13 Aug 2012 - 16 Aug 2012
M2 San Diego, USA
%F PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
%9 Contribution to a conference proceedingsContribution to a book
%U <Go to ISI:>//WOS:000311837900002
%R 10.1117/12.930075
%U https://bib-pubdb1.desy.de/record/151996