TY  - JOUR
AU  - Fitting, H.-J.
AU  - Fitting Kourkoutis, L.
AU  - Schmidt, B.
AU  - Liedke, B.
AU  - Ivanova, E. V.
AU  - Zamoryanskaya, M. V.
AU  - Pustovarov, V. A.
AU  - Zatsepin, A. F.
AU  - DESY
TI  - Electron microscopic imaging of an ion beam mixed SiO<sub>2</sub>/Si interface correlated with photo and cathodoluminescence
JO  - Physica status solidi / A
VL  - 209
SN  - 0031-8965
CY  - Weinheim
PB  - Wiley-VCH
M1  - PHPPUBDB-23993
SP  - 1101-1108
PY  - 2012
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000305122300016
DO  - DOI:10.1002/pssa.201127617
UR  - https://bib-pubdb1.desy.de/record/139600
ER  -