| Home > Publications database > X-ray diffraction at constant penetration depth - a viable approach for characterizing steep residual stress gradients |
| Journal Article | PHPPUBDB-9972 |
; ; ; ;
2008
Munksgaard
Copenhagen
This record in other databases:
Please use a persistent id in citations: doi:10.1107/S0021889807066836
|
The record appears in these collections: |