% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Lonsdale:646291,
      author       = {Lonsdale, Cameron and McMahon, Malcolm},
      collaboration = {McHardy, James and Storm, Christian and Glazyrin,
                      Konstantin and Mezouar, Mohamed},
      title        = {{A} closer look under extreme pressure: sub-micron
                      diffraction mapping in a diamond anvil cell},
      journal      = {High pressure research},
      volume       = {46},
      issn         = {0895-7959},
      address      = {London [u.a.]},
      publisher    = {Taylor and Francis},
      reportid     = {PUBDB-2026-00808},
      pages        = {1 - 26},
      year         = {2026},
      abstract     = {Investigating materials under extreme pressure using
                      diamond anvil cells (DACs) requires very small samples.
                      X-ray diffraction studies of such samples therefore require
                      beams focused to <5 μm. Fortuitously, advances in
                      light-source and beamline design mean that modern
                      synchrotrons, such as PETRA III and ESRF-EBS, now deliver
                      sub-μm focusing. Combined with increased source brightness,
                      fast motors, user-friendly control interfaces, and data
                      processing advances, 2D mapping of microscopic samples
                      becomes routine, with exposures on mid-Z samples reduced to
                      seconds. We demonstrate the use of sub-μm beams, with
                      high-resolution 2D scans, to map pressure and strain
                      gradients. We show how small scans are applied to collect
                      optimum data, and how the sample can affect the pressure
                      inferred from the pressure calibrant. Although sub-μm beams
                      can improve compressibility data, they may also introduce
                      undersampling, revealing variability on μm length scales.
                      We provide recommendations for the use of sub-μm beams for
                      extreme conditions research.},
      cin          = {DOOR ; HAS-User / FS-PET-D},
      ddc          = {530},
      cid          = {I:(DE-H253)HAS-User-20120731 /
                      I:(DE-H253)FS-PET-D-20190712},
      pnm          = {631 - Matter – Dynamics, Mechanisms and Control
                      (POF4-631) / 6G3 - PETRA III (DESY) (POF4-6G3) /
                      FS-Proposal: I-20181032 EC (I-20181032-EC) / FS-Proposal:
                      I-20211547 (I-20211547) / FS-Proposal: I-20220638
                      (I-20220638) / FS-Proposal: I-20230886 (I-20230886) /
                      FS-Proposal: I-20240226 (I-20240226)},
      pid          = {G:(DE-HGF)POF4-631 / G:(DE-HGF)POF4-6G3 /
                      G:(DE-H253)I-20181032-EC / G:(DE-H253)I-20211547 /
                      G:(DE-H253)I-20220638 / G:(DE-H253)I-20230886 /
                      G:(DE-H253)I-20240226},
      experiment   = {EXP:(DE-H253)P-P02.2-20150101},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.1080/08957959.2026.2615094},
      url          = {https://bib-pubdb1.desy.de/record/646291},
}