| Home > Publications database > Multiple energy X-ray holography: Incident-radiation polarization effects |
| Journal Article | PUBDB-2017-06435 |
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1997
Inst.
Woodbury, NY
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Please use a persistent id in citations: doi:10.1103/PhysRevB.56.1529 doi:10.3204/PUBDB-2017-06435
Abstract: Multiple energy x-ray holography (MEXH) measures both phase and amplitude information for x rays scattered from an incident reference beam, from which three-dimensional atomic images can be directly reconstructed. The angular distribution of the x-ray scattering is highly dependent on the polarization direction via the Thomson scattering cross section. We consider here the effect of incident x-ray polarization on images of Fe atoms reconstructed from theoretical and experimental MEXH data for α−Fe2O3(001) (hematite). We also illustrate such polarization effects theoretically in the enhancement of specific atomic structural information of ideal Fe trimers, and a Ge δ-layer buried in Si(001), where the use of different polarization modes and experimental geometries is found to strongly influence atomic images.
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