TY  - CHAP
AU  - Vonk, Vedran
AU  - Graafsma, Heinz
TI  - In-situ X-ray Diffraction at Synchrotrons and Free-Electron Laser Sources
VL  - 193
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
M1  - PUBDB-2015-01034
SN  - 978-3-642-45151-5 (print)
T2  - Springer Series in Materials Science
SP  - 39 - 58
PY  - 2014
LB  - PUB:(DE-HGF)7
UR  - <Go to ISI:>//WOS:000354119900003
DO  - DOI:10.1007/978-3-642-45152-2_2
UR  - https://bib-pubdb1.desy.de/record/206590
ER  -