% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Guo:206539,
      author       = {Guo, Shuai and Herzig, Eva M. and Naumann, Anna and
                      Tainter, Gregory and Perlich, Jan and Müller-Buschbaum,
                      Peter},
      title        = {{I}nfluence of {S}olvent and {S}olvent {A}dditive on the
                      {M}orphology of {PTB}7 {F}ilms {P}robed via {X}-ray
                      {S}cattering},
      journal      = {The journal of physical chemistry / B},
      volume       = {118},
      number       = {1},
      issn         = {1520-5207},
      address      = {Washington, DC},
      publisher    = {Soc.},
      reportid     = {PUBDB-2015-01003},
      pages        = {344 - 350},
      year         = {2014},
      note         = {(c) American Chemical Society. Post referee full text in
                      progress.},
      abstract     = {Films of the semiconducting polymer
                      poly[[4,8-bis[(2-ethylhexyl)oxy]benzo[1,2-b:4,5-b′]dithiophene-2,6-diyl][3-fluoro-2-[(2-ethylhexyl)carbonyl]thieno[3,4-b]thiophenediyl]]
                      with $40\%$ fluorinated monomers, denoted PTB7-F40, are spin
                      coated out of different solvents onto PEDOT:PSS films. The
                      influence of the used solvents chlorobenzene,
                      1,2-dichlorobenzene, and 1,2,4-trichlorobenzene as well as
                      the influence of the additive 1,8-diiodooctane (DIO) is
                      probed with grazing incidence small- and wide-angle X-ray
                      scattering (GISAXS and GIWAXS). As seen with GISAXS, without
                      DIO, the films are homogeneous and show roughness
                      correlation with the PEDOT:PSS film surface. With DIO, an
                      inner film structure with a size of 50–75 nm is found and
                      the roughness correlations weaken. In addition, as seen in
                      GIWAXS, the crystalline part of the films is influenced by
                      the used solvent if DIO is added.},
      cin          = {DOOR},
      ddc          = {530},
      cid          = {I:(DE-H253)HAS-User-20120731},
      pnm          = {DORIS Beamline BW4 (POF2-54G13) / FS-Proposal: I-20110417
                      (I-20110417)},
      pid          = {G:(DE-H253)POF2-BW4-20130405 / G:(DE-H253)I-20110417},
      experiment   = {EXP:(DE-H253)D-BW4-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000329678000036},
      pubmed       = {pmid:24341791},
      doi          = {10.1021/jp410075a},
      url          = {https://bib-pubdb1.desy.de/record/206539},
}