IEEE design & test: D & T
	Common abbreviations: IEEE Des Test [iso] IEEE Des Test [dnlm] IEEE Des Test [iso]

Type:	journal
DDC:	600
Keywords(s):	Electrical and Electronic Engineering, Hardware and Architecture, Software
ISSN(s):	2168-2356, 2168-2364
Publisher:	IEEE : New York, NY 2013-
Country:	United States of America
Appears:	online, print
ID:	PERI:(DE-600)2714080-5

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection