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HOM Characterization for Beam Diagnostics at the European XFEL Injector
International Beam Instrumentation Conference 2016, IBIC2016, BarcelonaBarcelona, Spain, 13 Sep 2016 - 18 Sep 20162016-09-132016-09-18 JACoW 617-620 () [10.18429/JACOW-IBIC2016-WEPG03]  GO
Higher Order Modes (HOM) excited by bunched electron beams in accelerating cavities carry information about the beam position and phase. This principle is used at the FLASH facility, at DESY, for beam position monitoring in 1.3 and 3.9 GHz cavities. [...]
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